Multi-probe Inspection System for Dynamic Surface Topology Scanning
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional non-destructive inspection systems are time-consuming due to the constant mounting and removal of different probes of varying sizes from a motion platform, which is inefficient for scanning structures with diverse surface topologies.
Innovation Solution
A multi-probe non-destructive inspection system with a motion platform and tool assembly that includes a plurality of probe assemblies, each with linear and radial actuators, allowing for dynamic selection and positioning of probes based on structural features, using sensors for navigation and data capture to optimize scanning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If different probes of different sizes are mounted and removed one at a time from a motion platform, then the system can inspect different surface topologies, but the inspection process becomes time-consuming
Solution Approach 1:
The patent combines multiple probes of different sizes into a single integrated probe assembly that can be mounted once on the motion platform. This assembly contains various probes that can be selectively activated based on the surface topology being inspected, eliminating the need to repeatedly mount and remove different probes during the inspection process.
Solution Approach 2:
The probe assembly is designed as a universal component that can perform multiple inspection functions by switching between different probes within the same assembly. This multi-functional design allows the system to adapt to different surface topologies without requiring separate probe installations, thereby reducing time loss while maintaining versatility.
2Loss of time
If multiple probes are integrated in a single assembly, then probe mounting time is reduced, but the complexity of the probe assembly increases
Solution Approach 1:
The probe assembly is segmented into multiple independent probes that can be individually selected and activated. Each probe within the assembly is designed as a separate functional unit, allowing the system to engage only the specific probes needed for particular inspection tasks. This segmentation reduces the overall complexity by enabling selective activation rather than requiring all probes to be fully integrated and active simultaneously.
Data Source
Figure 1
Figure 2
Figure 3
AI summary
Disclosed herein is a non-destructive inspection system. The non-destructive inspection system comprises a motion platform and a tool assembly. The tool assembly is coupled to the motion platform such that the tool assembly is movable relative to the motion platform. The tool assembly comprises an inspection tool assembly that comprises a base structure coupled to the tool assembly and a plurality of probe assemblies coupled to the base structure. Each probe assembly comprises a first linear actuator and a probe, different from the probe of any other one of the plurality of probe assemblies, for inspecting a different structural feature of a structure. Each probe is moveable, along a first axis relative to another one of the probes and substantially perpendicular to the base structure, using the first linear actuator of the corresponding one of the plurality of probe assemblies.