Multi-Projector Alignment Correction via Unified Pattern Detection
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Solution Overview
Problem
Existing stack projection techniques require complex and time-consuming correction processes to maintain precise alignment of multiple projectors, leading to increased system complexity, processing inefficiency, and degradation of image quality over time.
Innovation Solution
A projector system that includes a projection unit, a projection control unit, an imaging unit, and a correction processing unit to project and detect patterns representing measurement points, allowing for precise adjustment and correction of projector alignment by deriving correspondence relationships between coordinate systems, thereby enhancing the precision and efficiency of stack projection image formation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If correction processing is performed for each projector to achieve precise alignment, then manufacturing precision of projection alignment is improved, but device complexity and processing time increase
Solution Approach 1:
The patent combines the correction processing functions of multiple projectors into a single integrated correction process. Instead of each projector performing independent correction, the system executes unified correction processing that simultaneously adjusts all projectors, reducing control complexity while maintaining alignment precision.
Solution Approach 2:
The correction processing unit is designed to handle multiple projectors with a single universal correction algorithm. The same correction logic and processing steps are applied across all projectors in the stack, eliminating the need for projector-specific correction routines and simplifying the overall system control.
2Manufacturing precision
If multiple correction processes are executed to achieve desired projection image relationship, then manufacturing precision is improved, but productivity decreases
Solution Approach 1:
The system performs preliminary capture of projection images containing patterns from all projectors before executing correction processing. By preparing all necessary image data in advance, the correction process can proceed efficiently in a single pass without requiring multiple iterative correction cycles, thus improving productivity while maintaining precision.
3Measurement precision
If complex correction processing is performed for each projector, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The image analysis unit detects patterns from multiple projectors simultaneously in a single processing operation rather than sequentially analyzing each projector's patterns separately. This combined detection approach maintains high measurement precision while reducing the total time required for pattern recognition and correction calculation.
Data Source
AI summary
A second projector projects and displays a measurement pattern on a projection screen while a first projector projects and displays another measurement pattern on the projection screen. The second projector causes an imaging unit to acquire a captured image including projection images of the two measurement patterns are captured, and detects coordinates of measurement points which are represented in the measurement patterns from the captured image. The second projector corrects the projection target image based on the coordinates such that the projection image by the first projector and its own projection image are in a desired relationship.