Multi-Reference Sensing System for Accurate Vegetation Index Measurement

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Solution Overview

Problem

The existing sensing systems face challenges in achieving high accuracy during measurements of inspection indices due to large differences in reflectance from reference reflection regions, which affect the correction of measurement light sources and exposure times for various wavelength bands.

Innovation Solution

A sensing system that includes multiple reference reflection regions with characteristics matching the inspection target for each wavelength band, allowing for simultaneous sensing with the inspection target, thereby reducing the difference in reflectance and optimizing exposure times.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single reference reflection region is used for measurement correction, then the device complexity is reduced, but the measurement precision deteriorates due to large reflectance differences across wavelength bands

Engineering Contradiction:
Improvenumber of reference reflection regionsVSAvoidmeasurement accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent divides the reference reflection region into multiple segments, each with different reflectance characteristics matched to specific wavelength bands. This segmentation allows each wavelength band to have its own reference region with appropriate reflectance properties, thereby improving measurement precision across all bands while maintaining manageable device complexity through modular design.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by assigning different reflectance characteristics to different reference reflection regions corresponding to different wavelength bands. Each reference region is optimized for its specific wavelength band, ensuring that the reference standard is locally appropriate for each measurement channel, which resolves the contradiction between simplicity and precision.

Inventive Principle:
Principle #3Local quality

2Measurement precision

If reference reflection regions with different reflectances are used for different wavelength bands, then the measurement precision is improved, but the device complexity increases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidnumber of reference reflection regions
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent implements multi-functionality by designing a system where multiple reference reflection regions with different reflectances can be managed and controlled by a single sensing device. The device is configured to automatically select and switch between different reference regions based on the wavelength band being measured, allowing one device to perform multiple functions across different wavelength ranges without proportionally increasing complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent introduces dynamic control mechanisms that allow the sensing device to adaptively select which reference reflection region to use based on the current measurement wavelength band. This dynamic switching capability enables the system to maintain high measurement precision across different wavelength bands while managing device complexity through intelligent control rather than static configuration of all possible reference regions simultaneously.

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If exposure times are optimized for high reflectance regions, then the measurement precision for those regions is improved, but the measurement precision for low reflectance regions deteriorates

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidadaptability to different reflectance levels
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent segments the measurement system into wavelength band-specific reference regions, each with optimized reflectance characteristics. This segmentation allows independent optimization of exposure times for each wavelength band, ensuring that each band receives appropriate exposure settings while maintaining adaptability across the entire spectral range through coordinated control of all segments.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies parameter changes by dynamically adjusting exposure times based on the reflectance characteristics of the current reference reflection region and wavelength band. The system changes exposure parameters adaptively rather than using fixed settings, allowing optimal measurement precision for each wavelength band while maintaining versatility across different reflectance levels through real-time parameter adjustment.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables more accurate measurements by ensuring that both the inspection target and reference regions fall within the dynamic range for each wavelength band, improving the specification of light sources and enhancing measurement accuracy.

Implementation Method 1

a reference reflection region having a predetermined reflectance in a predetermined wavelength band... a plurality of reference reflection regions having characteristics according to an inspection target, corresponding to a plurality of wavelength bands which are targets for sensing of the inspection target, and having different reflectances

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS11181470B2Sensing system, sensing method, and sensing device
Publication Date: 2021.11.23 SONY GROUP CORP
  • US11181470B2 patent drawing
  • US11181470B2 patent drawing
  • US11181470B2 patent drawing

AI summary

The present technology relates to a sensing system, a sensing method, and a sensing device which are capable of performing measurement with higher accuracy.A sensing system is configured such that a plurality of reference reflection regions having a reflectance corresponding to an inspection target are prepared for each wavelength band which is a target for sensing of the inspection target as reference reflection regions, and is configured to sense the reference reflection region having a reflectance corresponding to the inspection target for each wavelength band which is a target for sensing of the inspection target at the time of sensing a region including the inspection target and the reference reflection region. The present technology can be applied to a system for measuring a vegetation index such as a normalized difference vegetation index (NDVI).