Multi-Region Etalon for Self-Normalizing Optical Frequency Measurement

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Solution Overview

Problem

In fiber-optic communications and laser applications, existing optical frequency measurement devices face challenges in achieving accurate frequency control and high signal-to-interference and noise ratio (SINR) in gridless operation, especially when using a single etalon and reference beam, where low slope regions lead to large errors and reduced efficiency due to the need for a separate reference beam.

Innovation Solution

An optical frequency measurement device with an etalon having three regions, each with a different path length and phase difference, splits the input beam into three beams, allowing for self-normalization by measuring output intensities and determining ratios with slopes above a threshold, eliminating the need for a reference beam and enabling accurate frequency determination across a wide range.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single etalon and reference beam are used for frequency measurement, then the device structure is simple, but the measurement precision deteriorates in low slope regions leading to large errors

Engineering Contradiction:
Improvedevice structureVSAvoidfrequency measurement precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The single etalon is segmented into multiple regions (first region and second region) with different path lengths. Each region produces transmission peaks at different phases, allowing the system to operate in high-slope regions across the entire frequency band without requiring a reference beam, thus resolving the contradiction between device simplicity and measurement precision.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If a reference beam is used to enable frequency determination, then the measurement can be made across different regions, but the device efficiency deteriorates due to power diversion and reduced SINR

Engineering Contradiction:
Improvefrequency determination capabilityVSAvoiddevice efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The etalon is divided into multiple regions that collectively cover the entire frequency band with high-slope transmission peaks. This segmentation eliminates the need for a reference beam, as each region independently provides sufficient measurement signal, thereby maintaining device efficiency while enabling broad frequency determination capability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The multi-region etalon is self-sufficient for frequency measurement without requiring an external reference beam. The different path lengths of the regions create complementary transmission patterns that automatically provide the necessary measurement information across the entire frequency range, making the system self-service and eliminating power loss associated with reference beam diversion.

Inventive Principle:
Principle #25Self-service

3Adaptability or versatility

If the etalon operates in low slope regions, then the frequency coverage is broad, but the measurement precision deteriorates due to low SINR

Engineering Contradiction:
Improvefrequency coverage rangeVSAvoidSINR
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The etalon is segmented into multiple regions with different path lengths, where each region is optimized to provide high-slope transmission peaks at different frequency positions. This ensures that across the entire broad frequency coverage, the system always operates in high-slope regions with high SINR, resolving the contradiction between coverage range and measurement precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The path length parameter of the etalon regions is varied to create different phase shifts in transmission peaks. By changing the path length parameter across different regions, the system maintains high slope (and thus high SINR) across the entire frequency band, achieving both broad coverage and high precision simultaneously.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution achieves improved SINR and precise frequency locking without a reference beam, supporting gridless operation over a wide frequency band and enhancing accuracy by using self-normalizing ratios, which are independent of beam power and repeat periodically, thus reducing errors and increasing efficiency.

Implementation Method 1

As light bounces between the surfaces, transmitted rays interfere with each other, producing a characteristic interference pattern, which is based on the frequency and the optical distance between the plates.

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

An optical frequency measurement device with an etalon having three regions, each with a different path length and phase difference, splits the input beam into three beams

Methodology Applied
Scientific EffectOptical interference: Interference

Data Source

PatentUS11460347B2Optical frequency measurement device
Publication Date: 2022.10.04 WELLS FARGO BANK NA
  • US11460347B2 patent drawing
  • US11460347B2 patent drawing
  • US11460347B2 patent drawing

AI summary

An optical locker may include an assembly. The assembly may include a beam splitter, configured to split an input beam into at least three beams; an etalon having at least three regions, positioned so that each beam passes through a different region; a detector configured to measure output intensities, Tn, of the etalon for the beam; and a controller configured to determine a ratio, Ta/Tb, of the output intensities, wherein that ratio has a slope at the output intensities which is above a threshold, obtain a target frequency of the input beam, and determine an actual frequency of the input beam based on the target frequency and the ratio of the output intensities.