Multi-Region Substrate for Simultaneous Material Screening
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Solution Overview
Problem
The existing methods for screening large libraries of materials are inefficient due to the need for multiple screening techniques and manual handling, which increases the time required to characterize materials, especially when different techniques have different structural or environmental requirements.
Innovation Solution
A substrate with multiple sample locations, each featuring two regions adapted for different analytical measurements, allowing for simultaneous or sequential use of various techniques like x-ray diffraction, IR spectroscopy, and UV-Vis spectroscopy without the need for material transfer, using materials that are transparent or opaque to specific forms of radiation to optimize each analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple screening techniques are used to characterize materials libraries, then measurement precision and reliability are improved, but the time required for complete screening increases significantly
Solution Approach 1:
The patent combines multiple analytical techniques (X-ray diffraction, IR spectroscopy, UV-Vis spectroscopy, Raman spectroscopy, fluorescence spectroscopy, and optical microscopy) into a single integrated screening platform. Multiple sample locations on one substrate can be analyzed by different techniques simultaneously or sequentially without transferring samples between different instruments, thereby maintaining measurement precision while dramatically reducing screening time.
Solution Approach 2:
The screening platform is designed with universal sample locations that can accommodate and be analyzed by multiple different analytical techniques. Each sample location can serve multiple functions - the same physical location on the substrate can be analyzed by X-ray diffraction, IR spectroscopy, UV-Vis spectroscopy, or other techniques depending on the analytical requirements, eliminating the need for separate dedicated substrates for each technique.
2Adaptability or versatility
If material transfer and manual handling are performed for different screening techniques, then adaptability to different analytical requirements is improved, but device complexity and time consumption increase
Solution Approach 1:
The substrate design provides universal sample locations that are compatible with multiple analytical techniques. The same sample location can be analyzed by X-ray diffraction, IR spectroscopy, UV-Vis spectroscopy, Raman spectroscopy, fluorescence spectroscopy, or optical microscopy without requiring sample transfer or additional handling steps. This multi-functional design maintains adaptability to different analytical requirements while eliminating the complexity of manual sample handling.
Solution Approach 2:
The patent merges multiple analytical capabilities into a single integrated system where samples remain on one substrate throughout the screening process. By combining multiple techniques that can analyze the same sample location simultaneously or sequentially, the system achieves high versatility without requiring complex sample transfer mechanisms or multiple separate handling procedures.
3Reliability
If samples are analyzed by multiple different techniques with different structural requirements, then measurement reliability is improved, but the time required for complete characterization increases
Solution Approach 1:
The patent combines multiple characterization techniques that have different structural and environmental requirements into a single integrated platform. Samples can be analyzed by X-ray diffraction (requiring crystalline structure), IR spectroscopy (requiring molecular vibrations), UV-Vis spectroscopy (requiring electronic transitions), Raman spectroscopy (requiring vibrational modes), fluorescence spectroscopy (requiring fluorescent properties), and optical microscopy (requiring optical transparency) all on the same substrate without time-consuming transfers, thereby maintaining reliability while reducing characterization time.
4Productivity
If large libraries of materials are screened systematically, then productivity is improved, but the time required for complete screening increases
Solution Approach 1:
The patent merges multiple analytical techniques into a single screening platform, allowing systematic screening of large material libraries with high productivity. By eliminating the need for sample transfer between different instruments and enabling simultaneous or sequential analysis by multiple techniques on the same substrate, the system achieves high throughput while minimizing the total time required to complete comprehensive screening of large libraries.
Data Source
AI summary
Apparatus and methods for screening a library of materials. Materials are provided in a plurality of locations on a substrate. The locations include first regions that are sufficiently transparent to a first form of radiation to permit analysis of the portion of the sample material supported in the first region using a first analytical technique, and second regions that are sufficiently transparent to a second form of radiation to permit analysis of a portion of the sample supported in the second region using a second analytical technique, but are insufficiently transparent to the first form of radiation to permit analysis of the portion of the sample material supported in the second region using the first analytical technique. Sample materials are screened at one or more sample locations of the substrate using the first analytical technique in the first region and the second analytical technique in the second region.