Multi-scale Dot Pattern for Simultaneous Digital Image Correlation
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Solution Overview
Problem
Current digital image correlation methods require separate patterns and tests for measuring displacements and strains at different scales on a workpiece, making it inefficient to analyze characteristics across both large and small areas simultaneously.
Innovation Solution
A multiple-scale dot pattern is applied to a workpiece, where smaller dots form larger dots, allowing for simultaneous larger scale and smaller scale measurements using digital image correlation, enabling the same pattern to be used for both scales without interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate patterns are used for different scales, then measurement precision at each scale is improved, but device complexity and testing time increase
Solution Approach 1:
The patent combines multiple scale patterns into a single integrated pattern where smaller dots form larger dot structures. This merging allows the workpiece to be measured at both small and large scales simultaneously using one pattern, eliminating the need for separate patterns and reducing overall system complexity while maintaining measurement precision at each scale.
Solution Approach 2:
The multi-scale pattern serves multiple functions simultaneously - it enables digital image correlation measurements at both small and large scales with a single pattern application. This universal pattern replaces the need for multiple specialized patterns, making the measurement system more versatile and efficient without sacrificing measurement accuracy.
2Measurement precision
If separate tests are performed for different scales, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The patent merges small-scale and large-scale measurement capabilities into a single test setup using an integrated multi-scale pattern. This allows both scales to be measured simultaneously in one test run, eliminating the time required to perform separate tests while maintaining the measurement precision that would otherwise require dedicated single-scale testing.
Solution Approach 2:
The continuous multi-scale pattern allows uninterrupted simultaneous measurement at multiple scales during a single test. The pattern enables continuous data collection at both small and large scales without requiring test interruption, pattern reapplication, or system reconfiguration, thereby eliminating time loss while preserving measurement precision.
3Device complexity
If a single pattern is used for multiple scales, then device complexity is reduced, but measurement precision may deteriorate
Solution Approach 1:
The pattern is segmented into distinct hierarchical levels where smaller dots form larger dot structures. This segmentation allows the single pattern to provide distinct feature sets for different measurement scales - the smaller dots enable precise small-scale measurements while the larger dot structures enable accurate large-scale measurements, thus maintaining measurement precision across scales while using a unified pattern.
Solution Approach 2:
The pattern implements a nested structure where smaller dots are contained within and form the larger dot patterns. This nesting allows both small and large scale features to coexist in a single pattern without interference, enabling simultaneous multi-scale measurements with preserved precision while reducing device complexity through pattern unification.
Data Source
AI summary
A method and apparatus for digital image correlation. A camera system is used to obtain larger scale images of a larger scale dot pattern on a surface of a workpiece and smaller scale images of a smaller scale dot pattern on the surface of the same workpiece. The smaller scale dot pattern forms a larger dot in the larger scale dot pattern in the larger scale images. The larger scale images and the smaller scale images may be used to determine a measurement of the workpiece.