Multi-Sector Rotary Turret Test Handler for Electronic Components

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Solution Overview

Problem

Conventional turret test handlers experience bottlenecks due to long test times, as the rotary turret must remain idle during testing, significantly increasing the overall testing cycle time.

Innovation Solution

A test handler with a primary rotary turret and a secondary rotary turret featuring multiple independently rotatable test sectors and testing devices, allowing continuous processing and testing without idle time, as components are transferred between sectors while others are being tested.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a conventional rotary turret is used for testing electronic components, then the structure is simple and easy to operate, but the overall testing cycle time becomes too long due to idle time during testing

Engineering Contradiction:

Improvetesting cycle timeVSAvoididle time at testing station

Core Design Contradiction:

ProductivityVSLoss of time

Solution Approach 1:

The rotary turret is divided into multiple independent testing sectors (first testing sector, second testing sector, etc.), each capable of performing testing operations independently. This segmentation allows different components to be tested in different sectors simultaneously, eliminating the idle time that occurs when a single turret must wait for testing to complete before picking up the next component.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The system maintains continuous useful action by having multiple testing sectors operate in parallel. While one sector is performing testing on a component, another sector can simultaneously pick up the next component or perform testing on a different component. This continuity eliminates idle time and keeps the system constantly productive throughout the testing cycle.

Inventive Principle:

Principle #20Continuity of useful action

2Productivity

If the rotary turret waits for testing to complete before picking up the next component, then testing accuracy is maintained, but throughput decreases significantly

Engineering Contradiction:

ImprovethroughputVSAvoidtesting accuracy

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

By segmenting the testing process into multiple independent sectors, each sector can complete testing on its assigned component without interfering with other sectors. This ensures that testing accuracy is maintained in each sector while the overall system throughput increases due to parallel operations.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The system uses intermediate transfer mechanisms between testing sectors to move components smoothly from one sector to another. This intermediary approach allows components to be transferred without disrupting the testing process in either sector, maintaining both accuracy and continuous flow.

Inventive Principle:

Principle #24Intermediary (Mediator)

Data Source

PatentUS11592477B2Test handler having multiple testing sectors

Publication Date: 2023.02.28 ASMPT SINGAPORE PTE LTD

AI summary

A test handler comprising a primary rotary turret comprising pick heads for transporting electronic components, and a secondary rotary turret arranged and configured to receive electronic components directly or indirectly from the primary rotary turret, the secondary rotary turret including multiple separate test sectors having component carriers for carrying the electronic components received from the primary rotary turret, wherein the multiple test sectors are rotatably movable relative to one another. The test handler also comprises at least one testing device positioned along a periphery of the secondary rotary turret, wherein the component carriers of the respective test sectors are operative to convey the electronic components to a position of the at least one testing device for testing.