Multi-Sensor Quality Scanning for Faster Defect Detection
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Solution Overview
Problem
Existing quality control processes in manufacturing are inefficient and fail to detect defects in components due to the use of separate testing devices, leading to the shipment of defective products and resource wastage.
Innovation Solution
A multi-sensor test device equipped with various sensors and artificial intelligence models that analyze sensor data to identify defects, enabling simultaneous and comprehensive defect detection across an entire manufacturing line.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If separate testing devices are used for quality control, then device complexity is reduced, but defect detection accuracy and completeness deteriorate
Solution Approach 1:
The patent combines multiple separate testing devices (optical sensor, acoustic sensor, thermal sensor) into a single integrated multi-sensor testing device. This merging allows simultaneous defect detection through multiple sensing modalities, improving detection accuracy and completeness while maintaining manageable system complexity through unified control architecture.
Solution Approach 2:
The integrated testing device performs multiple defect detection functions simultaneously using different sensing principles. The optical sensor detects surface defects, the acoustic sensor detects internal cracks, and the thermal sensor detects subsurface anomalies, making the single device universally capable of detecting various defect types that separate devices could only address individually.
2Device complexity
If multiple separate testing devices are used, then sensor data analysis is simplified, but defect detection speed and productivity deteriorate
Solution Approach 1:
The control system merges data acquisition, processing, and analysis functions for all sensors into a single integrated system. This allows parallel processing of optical, acoustic, and thermal data streams simultaneously, dramatically increasing defect detection speed compared to sequential analysis by separate devices, while the unified control architecture keeps the analysis process manageable.
3Device complexity
If separate testing devices are used, then resource allocation is simplified, but resource wastage increases due to missed defects
Solution Approach 1:
The integrated multi-sensor device combines multiple sensing capabilities in one system, ensuring comprehensive defect detection that prevents defective products from reaching customers. This eliminates resource wastage associated with customer complaints, returns, and reputation damage that occur when defects are missed by separate testing devices, while the unified configuration simplifies resource allocation.
Data Source
AI summary
In some implementations, a test device may initiate a set of measurements by a set of sensors of the test device and of a device under test (DUT), wherein the DUT is a memory device. The test device may obtain the set of measurements of the DUT from the set of sensors based on initiating the set of measurements. The test device may analyze the set of measurements of the DUT, using a first model, to identify one or more defects present with the DUT. The test device may determine, using a second model, that the one or more defects present with the DUT satisfy a failure threshold. The test device may provide, based on the failure threshold being satisfied for the DUT, an output indicating that the failure threshold is satisfied for the DUT.