Multi-Source X-Ray Analysis System for Simultaneous Signal Collection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing X-ray analysis systems typically utilize a single X-ray source, limiting their ability to simultaneously perform multiple analyses and enhancing signal throughput.
Innovation Solution
The implementation of a multi-source X-ray analysis system, where multiple X-ray generating devices are configured to simultaneously generate rays, allowing for simultaneous irradiation of an analyzed object and detection of various signals such as fluorescence, reflected light, diffracted light, and scattered light.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a single X-ray source is used, then the system complexity is low, but the signal collection capability and throughput are limited
Solution Approach 1:
The patent combines multiple X-ray generating devices into a single ray source unit that can simultaneously emit rays through different emission paths. This merging approach enables the system to collect multiple signals simultaneously (fluorescence, reflected light, diffracted light, scattered light) while maintaining a unified source structure, thereby improving throughput without proportionally increasing system complexity
Solution Approach 2:
The ray source is designed with multi-functionality to perform multiple analysis types simultaneously including XRF, XRR, XRD, and SAX analyses. The same ray source unit can switch between different emission paths and detection modes, allowing a single device to serve multiple analytical functions and improve overall system productivity
2Quantity of substance
If multiple X-ray sources are provided with selection components, then the signal collection capability is improved, but the device complexity and operation complexity increase
Solution Approach 1:
Instead of providing multiple separate X-ray sources with selection components, the patent merges multiple emission paths into a single ray source unit. This eliminates the need for complex selection mechanisms while maintaining the ability to collect multiple signals simultaneously through different emission paths, thereby reducing operation complexity while preserving signal collection capability
Solution Approach 2:
The system employs dynamic control where the ray source can switch between different emission paths based on the required analysis type. This dynamic switching mechanism provides flexibility in operation without requiring multiple fixed sources, simplifying the operational interface while maintaining versatile signal collection capabilities
3Loss of time
If multiple analyses are performed sequentially, then the device complexity remains low, but the measurement time and throughput are increased
Solution Approach 1:
The patent merges multiple analysis capabilities into a single integrated system that can perform XRF, XRR, XRD, and SAX analyses simultaneously using the same ray source and detector configuration. This eliminates the need for sequential measurements and reduces measurement time without requiring multiple separate devices, thereby achieving faster throughput without proportionally increasing device complexity
Solution Approach 2:
The ray source and detection system are designed with universal multi-functionality to accommodate different analysis types. The same hardware configuration can switch between different emission paths and detection modes to perform multiple analyses simultaneously, reducing the need for dedicated devices for each analysis type and thereby decreasing overall measurement time
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This multi-source design enhances signal collection, improves throughput by reducing measurement time, and allows for the simultaneous performance of multiple analyses like XRF, XRR, XRD, and SAX, thereby improving measurement accuracy.
Implementation Method 1
a ray source, the ray source includes a plurality of ray generating devices configured to generate a ray
Implementation Method 2
a fluorescence detector configured to detect a fluorescence emitted by the analyzed object due to the analyzed object being irradiated by the ray
Implementation Method 3
a reflected light detector configured to detect a reflected light obtained by the analyzed object reflecting the ray
Implementation Method 4
a diffracted light detector configured to detect a diffracted light obtained by the analyzed object diffracting the ray
Implementation Method 5
a scattered light detector configured to detect a scattered light obtained by the analyzed object scattering the ray
Data Source
AI summary
An X-ray analysis system is provided with multi-source design and an X-ray analysis method is provided with multi-source design. According to the embodiments, the X-ray analysis system includes a ray source including a plurality of ray generating devices that generate a ray; a detector that detects a signal generated due to an analyzed object being irradiated by the ray from the ray source; and a controller that controls the ray source, so that two or more ray generating devices in the ray source simultaneously generate corresponding rays to irradiate the analyzed object.