Multi-Source X-Ray Inspection for Real-Time 3D In-Line Imaging

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Solution Overview

Problem

Existing X-ray nondestructive inspection methods, particularly for products with complex structures, are unable to perform real-time in-line inspections due to the time-consuming nature of three-dimensional computerized tomography equipment, limiting production speed.

Innovation Solution

An X-ray inspection apparatus and method utilizing a transfer unit, multiple X-ray sources arranged in various configurations, and a detection unit to acquire two-dimensional or three-dimensional images of a moving subject in real time, enabling synchronized X-ray radiation and image processing without mechanical rotation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If three-dimensional computerized tomography equipment is used for inspection, then measurement precision and image quality are improved, but inspection time increases significantly

Engineering Contradiction:
Improveinspection accuracyVSAvoidinspection time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The inspection system is divided into multiple independent X-ray sources arranged in parallel, each capturing a specific angular view. This segmentation allows simultaneous multi-angle acquisition without requiring sequential rotation, thereby maintaining high measurement precision while dramatically reducing inspection time

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system transitions from a single rotating X-ray source to a multi-dimensional array of fixed X-ray sources. By adding spatial arrangement in multiple directions rather than temporal rotation, the system achieves three-dimensional inspection capability in real-time, resolving the contradiction between precision and speed

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If a single X-ray source is used, then device complexity is reduced, but productivity and inspection speed decrease

Engineering Contradiction:
Improveinspection speedVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

Multiple X-ray sources are merged into a single inspection system with coordinated control. The sources work simultaneously from different positions, combining their individual capabilities to achieve high-speed three-dimensional inspection while sharing common detection and processing infrastructure

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system design allows the multi-source array to perform multiple functions: two-dimensional imaging, three-dimensional reconstruction, and real-time inspection. The same hardware configuration adapts to different inspection modes and product types, improving productivity without proportionally increasing complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables fast and efficient in-line inspection of moving products by generating high-resolution images or tomograms in real time, enhancing production speed and efficiency.

Implementation Method 1

a plurality of X-ray sources arranged to be spaced apart from each other in a second direction intersecting the first direction and configured to radiate X-rays toward the subject, an X-ray control unit configured to control an arrangement of the plurality of X-ray sources, a detection unit positioned below the transfer unit and configured to detect an X-ray transmission image of the X-rays passing through the subject

Methodology Applied
Scientific EffectX-ray transmission: X-Ray

Data Source

PatentUS20260079120A1Apparatus and method for inspecting x-ray
Publication Date: 2026.03.19 ELECTRONICS & TELECOMM RES INST
  • US20260079120A1 patent drawing
  • US20260079120A1 patent drawing
  • US20260079120A1 patent drawing

AI summary

The present invention relates to an X-ray inspection apparatus and method. The X-ray inspection apparatus according to one embodiment includes a transfer unit configured to transfer a subject in a first direction, a plurality of X-ray sources arranged to be spaced apart from each other in a second direction intersecting the first direction and configured to radiate X-rays toward the subject, an X-ray control unit configured to control an arrangement of the plurality of X-ray sources, a detection unit positioned below the transfer unit and configured to detect an X-ray transmission image passing of the X-rays through the subject, and an image processing unit configured to generate an X-ray image based on the X-ray transmission image detected by the detection unit.