Multi-Source X-Ray Stress Measurement Using Segmented Irradiation
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Solution Overview
Problem
Conventional X-ray stress measurement methods require lengthy measurement times due to the need to vary the Ψ angle multiple times and use a single X-ray source, making it difficult to determine stress gradients in a depth direction efficiently.
Innovation Solution
The method involves using multiple X-ray sources to irradiate a sample at different incident angles, focusing on Debye-rings to simultaneously obtain X-ray diffraction information at various Ψ angles, allowing for rapid stress measurement and stress gradient analysis in the depth direction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single X-ray source is used to measure stress by varying the Ψ angle multiple times, then measurement accuracy is maintained, but measurement time becomes excessively long
Solution Approach 1:
The patent divides the X-ray measurement system into multiple independent X-ray sources (at least two), each capable of irradiating the sample at different incident angles simultaneously. This segmentation allows parallel acquisition of diffraction data at multiple Ψ angles, resolving the contradiction between maintaining measurement accuracy and reducing measurement time.
Solution Approach 2:
The patent introduces a new spatial dimension by arranging multiple X-ray sources at different positions and incident angles relative to the sample. Instead of sequentially varying the Ψ angle with a single source, the system simultaneously captures diffraction information from multiple angles in a multi-dimensional spatial configuration, enabling rapid stress measurement without compromising accuracy.
2Manufacturing precision
If the incident angle is varied or multiple X-ray sources are exchanged to determine stress gradient in depth direction, then depth resolution is achieved, but measurement time increases further
Solution Approach 1:
The patent employs multiple X-ray sources positioned at different incident angles, where each source contributes to measuring stress at different depths simultaneously. This parallel segmentation of the measurement function across multiple sources eliminates the need for sequential angle variation or source exchange, achieving rapid stress gradient measurement in the depth direction.
Solution Approach 2:
The patent enables continuous simultaneous measurement by having multiple X-ray sources operate concurrently at different incident angles. Instead of interrupting the measurement process to vary angles or exchange sources, the system maintains continuous useful action through parallel data acquisition, resolving the time-consuming nature of traditional depth-resolved stress gradient measurement.
3Productivity
If multiple X-ray sources are used to irradiate the sample simultaneously at different incident angles, then measurement speed is improved, but device complexity increases
Solution Approach 1:
While segmentation into multiple X-ray sources does increase device complexity, the patent justifies this by demonstrating that the parallel measurement capability provides substantial productivity improvement. Each segmented source operates independently at a fixed incident angle, simplifying the control system compared to sequential angle variation mechanisms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces measurement time by obtaining information for multiple Ψ angles simultaneously, enabling faster and more precise determination of stress and stress gradients within the sample.
Implementation Method 1
irradiating a sample with X-rays at a plurality of different incident angles from a plurality of X-ray sources; focusing attention on a Debye-ring of each X-ray diffraction radiated conically from the sample in association with incident X-ray emitted from each of the X-ray sources
Data Source
AI summary
A sample (1) is irradiated with X-rays at different incident angles from plural X-ray sources (21, 22). Attention is focused on a Debye-ring of each X-ray diffraction emitted conically from the sample in association with incident X-ray from each of the X-ray sources (21, 22), and stress in the sample (1) is determined on the basis of information of X-ray diffraction appearing at an intersection point between the Debye-ring of the X-ray diffraction recorded on an image plate (30) and an equatorial plane (H) and information of X-ray diffraction appearing in the neighborhood of the intersection point between the Debye-ring and the equatorial plane (H).