Multi-Stage Cam Test Device for Variable Component Thickness
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Solution Overview
Problem
Existing burn-in sockets for testing electronic components have complex pressing mechanisms and high manufacturing costs, making them inefficient and costly for testing various electronic products with different thicknesses.
Innovation Solution
A test device with a multi-stage adjusting cam and a detachable tray member, allowing for adjustable pressing distances and easy adaptation to different thicknesses, coupled with a simple and cost-effective design that includes a spring-supported pusher and a heat-dissipation member.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a burn-in socket includes a pusher for pressing the electronic component and a heat-dissipation member for dissipating heat, then the testing function is improved, but the device complexity increases and manufacturing costs rise
Solution Approach 1:
The pusher and heat-dissipation member are merged into a single integrated component. The pusher includes a pressing portion that contacts the electronic component and a heat-dissipation portion that extends to dissipate heat, eliminating the need for separate heat-dissipation members and simplifying the overall structure.
Solution Approach 2:
The pusher is designed to perform multiple functions simultaneously: it provides pressing force to ensure electrical contact between the component and substrate, while its heat-dissipation portion conducts and dissipates heat generated during testing. This multi-functionality reduces the number of components needed.
2Reliability
If a burn-in socket includes a pusher for pressing the electronic component and a heat-dissipation member for dissipating heat, then the testing function is improved, but the manufacturing costs increase
Solution Approach 1:
The pusher and heat-dissipation member are merged into a single integrated component. The pusher includes a pressing portion that contacts the electronic component and a heat-dissipation portion that extends to dissipate heat, eliminating the need for separate heat-dissipation members and simplifying the overall structure.
Solution Approach 2:
The pusher is designed to perform multiple functions simultaneously: it provides pressing force to ensure electrical contact between the component and substrate, while its heat-dissipation portion conducts and dissipates heat generated during testing. This multi-functionality reduces the number of components needed.
3Adaptability or versatility
If the test device is designed to test various kinds of electronic products, then the adaptability is improved, but the device complexity increases
Solution Approach 1:
The pressing force is made adjustable through a spring mechanism that allows the pusher to adapt to different electronic component thicknesses. The spring can be replaced or adjusted to provide appropriate pressing force for various component types, enabling the device to handle diverse products without structural modifications.
Solution Approach 2:
The pressing distance and force parameters are made variable through the spring mechanism and adjustable stop positions. This allows the same device structure to test electronic products of varying thicknesses by changing the pressing parameters rather than modifying the overall device structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient testing of electronic components with varying thicknesses using a single device, reducing manufacturing costs and improving operational simplicity while maintaining effective heat dissipation.
Implementation Method 1
The cover unit may comprise a spring elastically supporting the pusher against the cover body.
Implementation Method 2
a heat-dissipation member for providing a cooling effect when the electronic component is tested under the condition of high temperature
Data Source
AI summary
A test device for testing electric properties of an object. The test device includes an object support unit configured to support an object; a cover unit configured to include a cover body coupled to the object support unit and a pusher supported by the cover body so as to move toward and away from the object; and a pressure adjuster configured to include a multi-stage adjusting cam which is rotatably provided in the cover body while contacting the pusher and has a multi-stage contact pressing portion with contact radii varied depending on rotated angles so that the pusher can be in a moving-back position and be positioned at a plurality of pressing distances from the cover body, and an operation unit which operates the multi-stage adjusting cam.


