Multi-Stage Latch Architecture for Low-Power Clock Gating

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Solution Overview

Problem

Conventional flip-flop circuit designs are inefficient due to power leakage and large area usage, leading to low yield and inefficient chip space utilization in modern low-power applications.

Innovation Solution

The implementation of a multi-stage flip-flop latching architecture with NAND and NOR based circuitry, featuring a data path stage, a set/reset signal generation stage, and a slave latch stage, optimized for reduced transistor count and power consumption, which operates as a clock gating latch to improve area efficiency and power savings.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional flip-flops are used in circuit designs, then reliable latching function is achieved, but power consumption increases due to leakage and large area

Engineering Contradiction:
Improvelatching functionVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The flip-flop is divided into two separate stages: a first stage providing a data path for the input data signal, and a second stage providing set/reset signals. This segmentation allows each stage to be optimized independently, with the first stage focusing on data transmission and the second stage on control signal generation, thereby reducing overall power consumption while maintaining reliable latching function.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a multi-stage architectural dimension, transforming the conventional single-stage flip-flop into a distributed multi-stage system. This dimensional change enables better separation of functions (data path vs. control signals) and allows for optimized transistor sizing and placement, reducing leakage current and power consumption while preserving the essential latching behavior.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If conventional flip-flops are used in circuit designs, then reliable latching function is achieved, but chip area efficiency decreases due to large area usage

Engineering Contradiction:
Improvelatching functionVSAvoidchip area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

By segmenting the flip-flop into distinct stages with specialized functions, the patent enables more compact layout arrangements. The first stage (data path) and second stage (set/reset generation) can be positioned to minimize interconnect length and overlap, improving area efficiency while maintaining the reliable latching function through preserved signal paths and feedback mechanisms.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent merges the set and reset signal generation into a single second stage that receives the same intermediate data signal and clock signal to generate both control signals. This merging reduces redundant circuitry and minimizes the total area required compared to conventional designs that separately implement set and reset logic, thereby improving chip area efficiency while maintaining reliable operation.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If conventional flip-flops are used in circuit designs, then standard latching behavior is achieved, but manufacturing yield decreases

Engineering Contradiction:
Improvelatching behaviorVSAvoidmanufacturing yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The segmented multi-stage architecture allows for independent optimization and testing of each stage during manufacturing. The first stage (data path) and second stage (control signals) can be characterized separately, enabling better yield prediction and reduced variability in the final product. This segmentation improves manufacturing yield by isolating potential failure modes and enabling targeted process adjustments.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs parameter changes in the transistor sizing and threshold voltages across different stages to optimize both yield and performance. By adjusting parameters such as transistor width-to-length ratios and threshold voltages in the first and second stages independently, the design achieves better process margin and reduced sensitivity to manufacturing variations, thereby improving yield while maintaining standard latching behavior.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11456727B2Latch architecture for low power applications
Publication Date: 2022.09.27 ARM LTD
  • US11456727B2 patent drawing
  • US11456727B2 patent drawing
  • US11456727B2 patent drawing

AI summary

Various implementations described herein are directed to a device having multiple stages. The device may have a first stage that provides a data path for an input data signal. The first stage may receive the input data signal, receive feedback signals, and provide an intermediate data signal based on the input data signal and/or the feedback signals. The device may have a second stage that provides set/reset signals based on the intermediate data signal and/or a clock signal. The second stage may receive the intermediate data signal, receive the clock signal, and generate the set/reset signals based on the intermediate data signal and the clock signal. The second stage may also provide the set/reset signals as the feedback signals to the first stage.