Multi-Stage Substrate Holder with Embedded Electrodes for Plasma Processing

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Solution Overview

Problem

Current batch type plasma processing apparatuses face challenges in achieving high productivity and precise plasma control, particularly in forming films on multiple substrates simultaneously, as they have lower film formation rates compared to single-wafer type systems and lack precise plasma control.

Innovation Solution

A batch type plasma processing apparatus with a multi-stage substrate holder and embedded electrode layers, where RF power is supplied to the first electrode layers to generate plasma between stages, allowing for precise plasma control and high in-plane uniformity, similar to single-wafer type systems, while accommodating multiple substrates for simultaneous film formation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a batch type plasma processing apparatus is used to process multiple substrates simultaneously, then productivity is improved, but film formation rate and plasma control precision deteriorate compared to single-wafer type systems

Engineering Contradiction:
ImproveproductivityVSAvoidfilm formation rate and plasma control precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The substrate holder is divided into multiple stages (first stage, second stage, third stage) arranged in the height direction, with each stage capable of independent plasma generation through embedded electrode layers. This segmentation allows simultaneous processing of multiple substrates while maintaining individual plasma control for each stage, resolving the contradiction between batch processing productivity and plasma control precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each stage of the substrate holder is equipped with its own electrode layers (first electrode layer and second electrode layer) that can generate plasma locally. This local quality approach enables precise plasma control for each substrate position independently, even while processing multiple substrates simultaneously, thus maintaining manufacturing precision while improving productivity.

Inventive Principle:
Principle #3Local quality

2Productivity

If multiple substrates are processed simultaneously in a batch type apparatus, then productivity increases, but in-plane uniformity of film formation deteriorates

Engineering Contradiction:
ImproveproductivityVSAvoidin-plane uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The substrate holder is divided into multiple stages (first stage, second stage, third stage) arranged in the height direction, with each stage capable of independent plasma generation through embedded electrode layers. This segmentation allows simultaneous processing of multiple substrates while maintaining individual plasma control for each stage, resolving the contradiction between batch processing productivity and plasma control precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each stage of the substrate holder is equipped with its own electrode layers (first electrode layer and second electrode layer) that can generate plasma locally. This local quality approach enables precise plasma control for each substrate position independently, even while processing multiple substrates simultaneously, thus maintaining manufacturing precision while improving productivity.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus achieves high productivity and precise plasma processing performance equivalent to single-wafer type systems, enabling efficient film formation on multiple substrates with improved in-plane uniformity and productivity.

Implementation Method 1

activates the gas by a magnetic field component generated from an antenna to generate plasma

Methodology Applied
Scientific EffectPlasma generation: Plasma

Implementation Method 2

a magnetic field component generated from an antenna to generate plasma

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Implementation Method 3

including a heating part that heats the plurality of substrates

Methodology Applied
Scientific EffectThermal heating: Heating

Data Source

PatentUS20230245870A1Plasma processing apparatus and plasma processing method
Publication Date: 2023.08.03 TOKYO ELECTRON LTD
  • US20230245870A1 patent drawing
  • US20230245870A1 patent drawing
  • US20230245870A1 patent drawing

AI summary

A plasma processing apparatus includes: a substrate holder configured to place a plurality of substrates in a multi-stage structure in a height direction on the substrate holder; and a processing container in which the substrate holder is accommodated and including a heating part that heats the plurality of substrates, wherein the substrate holder is provided with a plurality of stages made of a dielectric material, and a first electrode layer and a second electrode layer embedded in the plurality of stages.