Multi-step Capacitor Structure for Edge Field Management

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Piezo-electric devices and semiconductor devices with integrated capacitors face dielectric breakdown issues due to high electric fields at the edge of the capacitor, leading to leakage currents and potential failure.

Innovation Solution

The implementation of a capacitor structure with a multi-step design, where the area of the first electrode is greater than the dielectric layer, and the dielectric layer is greater than the second electrode, along with a passivation layer and a floating conductive layer, reduces the electric field concentration at the edge by inducing a coupling reverse electric field.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional capacitor structure is used, then the device is simple to manufacture, but high electric field at the edge causes dielectric breakdown and leakage current

Engineering Contradiction:
Improveprevent dielectric breakdownVSAvoidcapacitor structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The capacitor structure is divided into multiple levels with different electrode areas. The first electrode has a larger area than the dielectric layer, and the dielectric layer has a larger area than the second electrode, creating a multi-level segmented structure that distributes the electric field more evenly and reduces edge concentration.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention transitions from a conventional two-electrode capacitor to a multi-level three-dimensional structure. By stacking electrodes and dielectric layers at different heights and areas, the solution adds a vertical dimension to distribute and manage the electric field, reducing edge concentration effects.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If the capacitor edge is exposed, then the manufacturing process is simple, but the high electrical field at the edge causes high leakage current

Engineering Contradiction:
Improvereduce leakage currentVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

Different regions of the capacitor structure are given different properties. The multi-level structure creates local variations in electrode and dielectric layer areas, with each level having optimized dimensions to control the electric field distribution specifically at edge regions, reducing leakage current locally where it occurs.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

Additional dielectric layers and electrode structures act as intermediaries between the top and bottom electrodes. These intermediate layers modify the electric field distribution and provide pathways that reduce field concentration at the edges, mediating the electrical interaction between electrodes.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration effectively reduces the electric field at the edge of the capacitor, thereby preventing dielectric breakdown and enhancing the reliability of piezo-electric and semiconductor devices.

Implementation Method 1

reduces the electric field concentration at the edge by inducing a coupling reverse electric field

Methodology Applied
Scientific EffectElectric field coupling: Electric Field

Implementation Method 2

the barrier layer prevents hydrogen from penetrating into the dielectric layer

Methodology Applied
Scientific EffectDiffusion barrier: Diffusion Barrier

Data Source

PatentUS10861929B2Electronic device including a capacitor
Publication Date: 2020.12.08 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10861929B2 patent drawing
  • US10861929B2 patent drawing
  • US10861929B2 patent drawing

AI summary

An electronic device includes a capacitor and a passivation layer covering the capacitor. The capacitor includes a first electrode, a dielectric layer disposed over the first electrode and a second electrode disposed over the dielectric layer. An area of the first electrode is greater than an area of the dielectric layer, and the area of the dielectric layer is greater than an area of the second electrode so that a side of the capacitor has a multi-step structure.