Multi-Surface Reflector for Compact Antenna Range Measurement

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Solution Overview

Problem

Current measurement systems for investigating far-field characteristics of devices, such as those in MIMO systems, are inefficient in terms of space and accuracy due to the use of single curved surface reflectors, leading to increased costs and reduced measurement capabilities.

Innovation Solution

A measurement system utilizing a reflector with at least two separate curved surfaces that generate separate plane waves, allowing for reduced measurement space and increased accuracy, along with a signal analysis unit for active measurements and potential interference reduction techniques like triangular mesh or ellipsoidal curves, to enhance efficiency and detail in far-field characterization.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single curved surface reflector is used, then the measurement system is simpler, but the measurement space cannot be minimized and accuracy is reduced

Engineering Contradiction:
Improvereflector structureVSAvoidmeasurement accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The reflector is divided into multiple separate curved surfaces (at least two), each generating independent plane waves. This segmentation allows each surface to be optimized for specific measurement angles and frequencies, thereby improving measurement accuracy while maintaining manageable complexity through modular design

Inventive Principle:
Principle #1Segmentation

2Device complexity

If a single curved surface reflector is used, then the device structure is simpler, but the required measurement space increases

Engineering Contradiction:
Improvereflector configurationVSAvoidmeasurement space
Core Design Contradiction:
Device complexityVSVolume of moving object

Solution Approach 1:

Multiple curved surfaces are arranged in a three-dimensional configuration around the device under test, creating plane waves from multiple directions. This spatial arrangement enables comprehensive far-field measurement within a compact volume by utilizing dimensional positioning rather than requiring a single large-scale measurement environment

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Device complexity

If a single curved surface reflector is used, then the system is less complex, but the measurement bandwidth is narrower

Engineering Contradiction:
Improvereflector designVSAvoidmeasurement bandwidth
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

Each curved surface is designed to generate plane waves over specific frequency ranges and angular sectors. By combining multiple surfaces with complementary characteristics, the system achieves wide overall bandwidth and multi-frequency measurement capability, making the system versatile for different measurement requirements

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution minimizes required measurement space, increases accuracy, and widens measurement bandwidth, enabling more efficient and cost-effective investigation of far-field characteristics, particularly for MIMO systems.

Implementation Method 1

a reflector (13), wherein said reflector (13) comprises at least two separate curved surfaces (13a, 13b) in the same physical entity in order to generate separate plane waves corresponding to the at least two measurement antennas (12a, 12b)

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS10587050B2Measurement system and method comprising a compact antenna range reflector
Publication Date: 2020.03.10 ROHDE & SCHWARZ GMBH & CO KG
  • US10587050B2 patent drawing
  • US10587050B2 patent drawing
  • US10587050B2 patent drawing

AI summary

A measurement system is provided. The measurement system comprises a device under test, at least two measurement antennas, and a reflector. In this context, the reflector comprises at least two separate curved surfaces in the same physical entity in order to generate separate plane waves corresponding to the at least two measurement antennas. The reflector is configured in such a manner that the separate plane waves converge in a quiet-zone comprising the device under test.