Multi-Wavelength Analysis Device Noise Reduction

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Solution Overview

Problem

Conventional automatic analysis methods, such as latex agglutination, face challenges in achieving high sensitivity and accuracy across a wide concentration range due to noise interference and limitations in wavelength selection, leading to gaps in calibration curves and insufficient noise reduction at low concentrations.

Innovation Solution

An automatic analysis device utilizing a plurality of wavelengths to calculate the concentration of a component by converting signals into a secondary parameter using a conversion table or expression, where the wavelength dependency of the signal and noise components are expressed through specific functions, with coefficients obtained via the least square method, and a weighting function that adjusts based on absorbance values to minimize noise influence.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single wavelength is used for measurement, then the device complexity is reduced, but the measurement precision deteriorates due to noise interference

Engineering Contradiction:
Improvewavelength measurement systemVSAvoidconcentration measurement accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent transitions from single-wavelength measurement to multi-wavelength measurement, adding the wavelength dimension to the measurement system. This allows the device to measure absorbance at multiple wavelengths simultaneously, enabling noise reduction through differential calculation while maintaining reasonable device complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the measurement parameter from single-wavelength absorbance to multi-wavelength absorbance differences. By calculating the difference between absorbance at the measurement wavelength and reference wavelength, the system eliminates common-mode noise while preserving the concentration signal.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If measurement is optimized for high concentration, then the manufacturing precision is improved, but the measurement precision deteriorates at low concentration due to small absorbance change

Engineering Contradiction:
Improvecalibration curve accuracyVSAvoidlow concentration sensitivity
Core Design Contradiction:
Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The patent applies different wavelengths strategically: the measurement wavelength is selected to maximize sensitivity at low concentrations, while the reference wavelength compensates for noise. This local optimization of wavelength selection enables accurate measurement across the entire concentration range, including low concentration regions where absorbance changes are small.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

By introducing multiple wavelengths, the system gains an additional dimension for optimizing measurement conditions. This allows simultaneous optimization for both high concentration accuracy and low concentration sensitivity through appropriate wavelength selection and differential calculation.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Measurement precision

If multiple wavelengths are used for measurement, then the measurement precision is improved through noise reduction, but the device complexity increases

Engineering Contradiction:
Improveconcentration measurement accuracyVSAvoidwavelength measurement system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent adds the wavelength dimension to measurements by using multiple wavelengths, which enables noise reduction through differential calculation. This dimensional expansion improves measurement precision while keeping the increase in device complexity manageable through efficient optical system design.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

4Ease of manufacture

If a linear calibration curve is used, then the ease of manufacture is improved, but the measurement precision deteriorates when measuring across wide concentration ranges

Engineering Contradiction:
Improvecalibration curve implementationVSAvoidwide range concentration measurement
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent changes the measurement parameter from absolute absorbance to absorbance difference between wavelengths. This parameter transformation enables the use of linear calibration curves even when measuring across wide concentration ranges, because the differential measurement compensates for non-linear effects and extends the linear dynamic range.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables high-accuracy analysis across a wide concentration range with high sensitivity, reducing noise interference and maintaining accuracy even at low concentrations, by effectively combining signals from multiple wavelengths and adjusting for wavelength-dependent noise.

Implementation Method 1

In the absorption photometry, light is irradiated to a reaction solution prepared by mixing a biological sample with a reagent in a reaction container, an absorbance which is the attenuation of light having a specific wavelength is measured

Methodology Applied
Scientific EffectAbsorption photometry: Absorption (EM radiation)

Implementation Method 2

a wavelength dependency of the signal component and a wavelength dependency of a noise component are expressed by synthesis of a function for expressing a wavelength dependency of a signal component and a function for expressing a wavelength dependency of a noise component

Methodology Applied
Scientific EffectLight absorption: Absorption (EM radiation)

Data Source

PatentUS8936754B2Automatic analysis device
Publication Date: 2015.01.20 HITACHI HIGH TECH CORP
  • US8936754B2 patent drawing
  • US8936754B2 patent drawing
  • US8936754B2 patent drawing

AI summary

There is provided a high-accuracy automatic analysis device achieving both of measurement in a wide concentration range and high sensitivity at a low concentration. The signals of a plurality of wavelengths λ1 to λ12 where the sensitivity of light absorption caused by fine particles is high from a light source 40 are converted to absorbances by a spectroscopic optical system (detector) 41. The absorbances are converted to a secondary parameter from in which a noise component is cancelled by using a previously-defined conversion table 54, so that a concentration of a measured material (predetermined component) is calculated by an operation unit (calculating means) 53 based on the secondary parameter. Thus, analysis being resistant to the noise even at the low concentration can be achieved in a range up to a high concentration.