Multi-Wavelength Laser Scanner for Surface Measurement
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Solution Overview
Problem
Current laser scanning technologies face challenges in achieving accurate measurements of object surfaces due to variations in reflectance, shape, and color, as well as interference issues like speckle patterns, which affect the accuracy of distance information capture.
Innovation Solution
The use of electromagnetic radiation with at least two different wavelengths allows for the generation of separate measurement values, enabling the selection of the most accurate value or calculation of a total measurement value, thereby reducing the impact of wavelength-dependent aberrations and interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If laser radiation with a single defined wavelength is used for surface capturing, then the device complexity is reduced and operation is simplified, but measurement precision deteriorates due to wavelength-dependent aberrations and interference patterns
Solution Approach 1:
The patent divides the single wavelength measurement into multiple wavelength measurements. By using at least two different wavelengths (first wavelength and second wavelength), the measurement process is segmented into separate measurement values that can be independently evaluated and combined, thereby improving overall measurement precision while managing device complexity through systematic multi-wavelength acquisition
Solution Approach 2:
The patent changes the wavelength parameter of the laser radiation to improve measurement precision. By varying the wavelength between at least two different values and capturing measurement values at each wavelength, the system overcomes wavelength-dependent aberrations and interference patterns that limit single-wavelength measurements
2Measurement precision
If electromagnetic radiation with at least two different wavelengths is used, then measurement precision is improved by reducing wavelength-dependent aberrations, but device complexity increases due to multiple beam sources and capturing configurations
Solution Approach 1:
The patent applies multi-functionality by using a single radiation generation device capable of emitting multiple wavelengths and a single capturing device that can capture reflections at different wavelengths. This universal configuration improves measurement precision through multi-wavelength data acquisition while avoiding the need for completely separate measurement systems for each wavelength
Solution Approach 2:
The patent combines multiple wavelength measurements into a unified measurement process. By merging the first measurement value (from first wavelength) and second measurement value (from second wavelength) into a single object information output, the system achieves improved precision through wavelength diversity while presenting a simplified integrated interface to the user
3Reliability
If multiple measurement values are captured at different wavelengths, then the reliability of distance information is improved, but the loss of time increases due to multiple measurement cycles
Solution Approach 1:
The patent maintains continuity of useful action by capturing multiple measurement values in a continuous measurement process. By acquiring both the first measurement value and second measurement value during the same measurement cycle rather than requiring separate measurement sessions, the system improves reliability through multiple data points while minimizing additional time consumption
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy of three-dimensional measurements by providing multiple measurement values that can be selected or averaged, improving the reliability of distance information and reducing the influence of interference and reflectance variations.
Implementation Method 1
a radiation generation device (17), in particular a laser scanner, having at least one beam source (14)
Implementation Method 2
The incident radiation forms a measurement region on the object surface... The incident laser radiation is reflected by the object surface (16) and captured by a suitable capturing device
Data Source
AI summary
An apparatus and method for capturing an object surface by electromagnetic radiation are provided. The apparatus includes a radiation generation device having a beam source and being configured to radiate a first and a second electromagnetic radiation having a first and second wavelength, respectively, onto a measurement point or a region of the object surface without emitting radiation onto the measurement point or onto the region, or without emitting radiation utilized for surface capturing, in a wavelength range between the first and the second wavelengths, a capturing device to capture for the measurement point a first and a second measurement value, the first measurement value being based on reflected radiation having the first wavelength and the second measurement value being based on reflected radiation having the second wavelength, and each of the first and second measurement values representing a distance between the capturing device and the object surface.