Multi-wavelength Phase Mask for 3D Particle Imaging

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Solution Overview

Problem

Current methods for three-dimensional imaging of multicolored particles face challenges in simultaneously measuring physical parameters like position, size, conformation, and local environment, particularly in achieving high spatial resolution and depth information with minimal modification to conventional microscopes.

Innovation Solution

The integration of a phase mask into a conventional microscope's optical path, which modifies light for each wavelength, allowing for simultaneous three-dimensional imaging of multiple objects labeled in different colors using a single optical channel, and the use of a 4f optical processing circuitry and wavelength-dependent optics to encode wavelength-based characteristics and three-dimensional positions directly in the image.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional microscopy methods are used for three-dimensional imaging of multicolored particles, then the system structure remains simple, but the ability to simultaneously measure physical parameters like position, size, conformation, and local environment with high spatial resolution is limited

Engineering Contradiction:
Improvespatial resolutionVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A phase mask is introduced as an intermediary optical element in the detection path. This phase mask modulates the optical path differences of light from different wavelengths, encoding three-dimensional position and wavelength information into the point spread function shape. This allows high-resolution 3D imaging of multicolored particles without requiring complex multi-channel detection systems

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the optical parameters by introducing wavelength-dependent phase delays through the phase mask. Different wavelengths experience different phase shifts, creating wavelength-specific point spread function shapes. This parameter change enables simultaneous measurement of position and wavelength information through a single optical channel, improving measurement precision without proportionally increasing device complexity

Inventive Principle:
Principle #35Parameter changes

2Loss of information

If multiple optical channels are used to image different wavelengths, then wavelength information can be separated, but the device complexity and cost increase significantly

Engineering Contradiction:
Improvewavelength informationVSAvoidoptical path complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The patent merges multiple wavelength detection channels into a single optical path by using a phase mask that encodes wavelength information in the point spread function shape. Instead of separating wavelengths into different optical paths with separate detectors, all wavelengths are detected simultaneously through one channel, with wavelength identification achieved through pattern recognition of the encoded point spread functions

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The phase mask serves multiple functions simultaneously: it acts as a wavelength separator, a 3D position encoder, and a signal modulator all within a single optical element. This multi-functionality eliminates the need for multiple specialized optical channels, reducing device complexity while preserving wavelength information

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Loss of information

If depth information is encoded in the image, then three-dimensional localization is achieved, but the spatial resolution may be compromised

Engineering Contradiction:
Improvedepth informationVSAvoidspatial resolution
Core Design Contradiction:
Loss of informationVSMeasurement precision

Solution Approach 1:

The patent encodes depth information by transforming it into another dimension - the shape of the point spread function. Instead of using depth encoding methods that occupy spatial dimensions and reduce resolution, the axial position information is mapped to the morphological characteristics of the point spread function, allowing simultaneous high-resolution lateral and axial localization

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables precise localization and tracking of objects in three dimensions over a customizable depth range, achieving high spatial resolution and efficient data acquisition with reduced complexity and cost compared to traditional techniques.

Implementation Method 1

the phase mask simultaneously providing different phase delays for each wavelength and using a single optical channel

Methodology Applied
Scientific EffectPhase delay: Phase Modulation

Data Source

PatentUS10791318B2Multi-wavelength phase mask
Publication Date: 2020.09.29 THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIV
  • US10791318B2 patent drawing
  • US10791318B2 patent drawing
  • US10791318B2 patent drawing

AI summary

Among other aspects, various embodiments include encoding wavelength-based characteristics, in addition to three-dimensional positions, of a plurality of objects of a plurality of different wavelengths directly in an image of the objects.