Multi-Wavelength Spectroscope for Color Patch Position Detection
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Solution Overview
Problem
Existing measurement devices face challenges in accurately determining the position of a measurement region within color patches, especially when adjacent patches have similar colors, due to small variations in signal values, making it difficult to detect the timing of signal constancy.
Innovation Solution
A measurement device and method that utilize a spectroscope to measure light with predetermined spectral wavelengths and a movement mechanism to determine if the measurement position has entered a color patch by executing measurement processing for multiple wavelengths, where the variation of measured values exceeds a first threshold and then falls below a second threshold, indicating entry into the patch.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a spectroscope measures signal values at a single wavelength when moving across color patches, then the device configuration is simple, but it becomes difficult to determine the timing when the measurement position enters a color patch when adjacent patches have similar colors
Solution Approach 1:
The patent transitions from single-wavelength measurement to multi-wavelength measurement, adding a spectral dimension to the detection process. By measuring signal values at multiple wavelengths simultaneously, the system creates a more robust detection mechanism that can distinguish between similar-color patches through their unique spectral signatures, thereby improving position detection accuracy without significantly increasing device complexity
Solution Approach 2:
The patent changes the measurement parameter from a single wavelength signal value to multiple wavelength signal values. By monitoring how signal values vary across different wavelengths and their rates of change, the system can more accurately determine when the measurement position enters a color patch, even when adjacent patches have similar colors. This parameter expansion enables precise detection while maintaining a relatively simple device configuration
2Adaptability or versatility
If color patches are arranged with similar colors adjacent to each other, then the color chart can represent a wider range of colors, but the variation in signal value becomes small making it difficult to detect entry timing
Solution Approach 1:
By introducing multi-wavelength measurement, the patent adds a spectral dimension that provides additional discrimination power. Even when adjacent color patches have similar appearance, they typically have different spectral characteristics. Measuring at multiple wavelengths allows the system to detect subtle spectral differences and accurately determine entry timing, thus enabling the use of color charts with broader color coverage
Solution Approach 2:
The patent uses the spectral information at multiple wavelengths as an intermediary to detect color patch boundaries. Instead of relying solely on the magnitude of signal value changes at a single wavelength, the system analyzes the spectral distribution and its variations across wavelengths. This intermediary spectral analysis provides a more sensitive indicator for detecting when the measurement position enters a color patch, overcoming the limitation of small signal variations in similar-color patches
3Productivity
If the spectroscope moves across color patches at high speed, then productivity is improved, but the timing when the measurement position enters a color patch becomes harder to determine
Solution Approach 1:
The patent employs multi-wavelength measurement to create a more robust detection signal that remains effective even at high scanning speeds. By analyzing signal variations across multiple wavelengths and their rates of change, the system can accurately determine entry timing without requiring slow movement. This multi-dimensional approach provides sufficient signal discrimination power to maintain measurement precision during high-speed operation, thus improving productivity
Solution Approach 2:
The patent performs measurement processing for multiple wavelengths simultaneously or in rapid succession, capturing spectral information before the measurement position fully enters or exits a color patch. By analyzing the temporal and spectral patterns of signal variations, the system can predict and accurately determine entry timing even during high-speed movement. This preliminary multi-wavelength sampling enables precise detection without sacrificing productivity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for accurate determination of the measurement position within a color patch even when adjacent patches have similar colors, enhancing position detection accuracy and simplifying the device configuration by using a single spectroscope to monitor variations across multiple wavelengths.
Implementation Method 1
a spectroscope configured to measure light with a predetermined spectral wavelength of incident light from a measurement target and change the spectral wavelength
Data Source
AI summary
Provided is a measurement device including a spectroscope, a movement mechanism configured to relatively move the spectroscope in one direction, and one or more processors configured to determine whether a measurement position measured by the spectroscope is moved into a color patch, in which the one or more processors cause the spectroscope to execute measurement processing for a plurality of wavelengths set in advance while relatively moving the spectroscope in the one direction, and when at least one of amounts of variation of measured values with respect to each of the plurality of wavelengths obtained in the measurement processing exceeds a first threshold value and then each of the amounts of variation of the measured values of the plurality of wavelengths falls below a second threshold value which is less than or equal to the first threshold value, determine that the measurement position is moved into the color patch.