Multi-Wavelength Thermal Radiation Identification of Material and Temperature
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Solution Overview
Problem
Existing methods for non-contact temperature measurement and material identification using thermal radiation face challenges in accuracy due to varying emissivity and lack of information on material properties, especially when the emissivity is not constant across wavelengths.
Innovation Solution
A method involving the comparison of intensity data from a target measured at multiple wavelengths with reference data from known materials, allowing for the identification of materials and temperatures by determining the highest degree of similarity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the two-color method is used to reduce emissivity error influence, then temperature measurement accuracy is improved, but material identification capability is lost
Solution Approach 1:
The patent extends the measurement from two wavelengths to multiple wavelengths (three or more), adding dimensional information to the measurement space. This allows simultaneous determination of temperature and material properties by analyzing the spectral distribution across multiple wavelength bands, transforming a 2D problem into a higher-dimensional solution space where both parameters can be resolved independently
Solution Approach 2:
The patent segments the spectral measurement into multiple discrete wavelength bands, each providing independent information. By measuring thermal radiation intensity at three or more distinct wavelengths and comparing each with reference data, the system can separately identify material characteristics and temperature, rather than relying on a single ratio measurement that loses material information
2Measurement precision
If thermal radiation intensity is measured at multiple wavelengths, then material identification accuracy is improved, but measurement complexity increases
Solution Approach 1:
The patent uses reference data that copies the thermal radiation characteristics of known materials measured under controlled conditions. By creating a database of reference spectra at multiple wavelengths for various materials, the system can identify unknown materials through pattern matching without requiring complex real-time analysis, effectively using pre-captured information to simplify the measurement process
Solution Approach 2:
The patent changes the measurement parameter from single-wavelength intensity to multi-wavelength spectral distribution. By measuring intensity ratios or absolute intensities across three or more wavelengths and comparing with reference data, the system extracts material identification information while using the multiple data points to compensate for increased measurement complexity through statistical analysis
3Measurement precision
If emissivity variation with wavelength is considered, then measurement accuracy for different materials is improved, but the simplicity of the two-color method is lost
Solution Approach 1:
The patent creates a universal measurement method that works for multiple materials with different emissivity characteristics by measuring at three or more wavelengths. The multi-wavelength approach provides enough independent equations to solve for both temperature and emissivity simultaneously, making the method universally applicable to various materials without requiring material-specific calibration, thus achieving multi-functionality
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables accurate non-contact identification of materials and temperatures, improving upon existing limitations by using a combination of thermal radiation intensities at multiple wavelengths and a database of reference materials.
Implementation Method 1
any object radiates fixed electromagnetic waves (infrared rays in a normal temperature range) based on a temperature thereof
Data Source
AI summary
Provided is to perform an identification of a temperature and/or a material of a target object to be measured in a non-contact and simple manner. A relationship between a wavelength and an emissivity of thermal radiation such as infrared rays radiated from an object is determined by the material of the object. In the present invention, the identification is performed by using this. In other words, the object above can be achieved by comparing thermal radiation intensities at a plurality of wavelengths from the given object with a database in the present invention. The database is stored by measuring the thermal radiation intensities at the plurality of wavelengths and temperatures for a plurality of materials in advance. An external light source is not required, and the target to be measured itself is used as a thermal radiation light source in this measurement.