Multi-Beam Writing Block Regions for Border Position Deviation

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Solution Overview

Problem

The existing multi-beam writing technique for semiconductor devices faces challenges with increased position deviation at the borders between stripe regions, leading to longer writing times due to the need for increased maximum irradiation time to accommodate larger dose modulation amounts.

Innovation Solution

A multi-charged particle beam writing apparatus and method that forms block regions from sub-regions within the irradiation area, allowing for writing without overlapping by using these block regions, thereby reducing position deviation and optimizing writing efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the maximum modulation amount of dose is increased to correct position deviation at stripe region borders, then the position deviation correction capability is improved, but the maximum irradiation time per shot needs to be increased, resulting in increased writing time

Engineering Contradiction:
Improveposition deviation correctionVSAvoidwriting time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent divides the irradiation region into multiple block regions, each surrounded by a different number of beams. This segmentation allows for localized dose modulation strategies that reduce the maximum modulation amount needed while maintaining position deviation correction capability. By treating different regions with different beam configurations, the system avoids the need to increase maximum irradiation time across the entire writing field.

Inventive Principle:
Principle #1Segmentation

2Productivity

If multiple beams are used to increase writing throughput, then the productivity is improved, but the position deviation at stripe region borders increases, requiring longer irradiation time

Engineering Contradiction:
Improvewriting throughputVSAvoidposition deviation
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent applies different beam configurations to different spatial locations by creating block regions with varying numbers of surrounding beams. This local quality approach allows the system to maintain high throughput with multiple beams while locally optimizing position deviation correction in border regions without requiring increased irradiation time.

Inventive Principle:
Principle #3Local quality

3Ease of manufacture

If the irradiation region is divided into stripe regions for systematic writing, then the writing process organization is improved, but the position deviation increases at the borders between stripe regions

Engineering Contradiction:
Improvewriting process organizationVSAvoidposition deviation at borders
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent further segments each stripe region into multiple block regions with different beam surround configurations. This additional segmentation level allows the system to maintain the organizational benefits of stripe regions while eliminating border position deviation issues by creating transition zones between blocks that accommodate positional variations.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively minimizes the maximum position deviation amount, reducing writing time and improving throughput by dividing the beam array into block regions for controlled irradiation, thus addressing the inefficiencies in existing multi-beam writing methods.

Implementation Method 1

a beam forming mechanism configured to form multiple charged particle beams

Methodology Applied
Scientific EffectCharged particle beam formation: Electron Beam

Data Source

PatentUS12537163B2Multi-charged particle beam writing apparatus, and multi-charged particle beam writing method
Publication Date: 2026.01.27 NUFLARE TECH INC
  • US12537163B2 patent drawing
  • US12537163B2 patent drawing
  • US12537163B2 patent drawing

AI summary

A multi-charged particle beam writing apparatus includes a beam forming mechanism to form multi-charged-particle-beams, a block region forming circuit to form plural block regions from an irradiation region of the multi-charged-particle-beams formed by combining plural sub-regions each surrounded by a beam, being different from each other, and plural other beams adjacent to the beam in the multi-charged-particle-beams, and a writing mechanism to perform, using the multi-charged-particle-beams, multiple writing such that irradiation of each block region of the plural block regions is at least performed by any one of writing processing of the multiple writing, and such that each writing processing of the multiple writing is performed to write a writing region of a target object in a manner of covering the writing region without overlapping by, using one of the plural block regions, irradiation of the one of the plural block regions.