Multi-Channel DAC Testing With On-Chip Error Comparison

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Solution Overview

Problem

The high costs and inefficiencies associated with testing multi-channel digital-to-analog converters (DACs) in large-scale manufacturing, including the need for expensive equipment and long test times, lead to high discard rates and reduced yield, as existing methods rely on complex testing equipment and calibrated reference DACs.

Innovation Solution

Implementing a multi-channel DAC with an integrated error detector that compares the outputs of two DAC channels with a pre-defined phase relationship, allowing for on-chip compensation and a simple one-bit output to indicate compliance with specifications, thereby reducing the need for external testing equipment and enabling rapid testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional testing equipment and methods are used to test DACs, then measurement precision can be achieved, but device complexity and testing cost increase significantly

Engineering Contradiction:
ImproveDAC output measurement accuracyVSAvoidtesting equipment complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent combines the reference DAC and error detector into a single integrated testing apparatus. The reference DAC generates reference signals and the error detector compares these with DAC under test outputs, merging multiple testing functions into one compact device that reduces complexity while maintaining measurement precision

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The error detector acts as an intermediary component that compares the DAC under test output with the reference DAC output. This intermediary device simplifies the testing architecture by providing a direct comparison mechanism rather than requiring separate measurement systems for each channel

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If comprehensive DAC testing is performed using traditional methods, then measurement precision is improved, but test time increases

Engineering Contradiction:
ImproveDAC parameter measurement accuracyVSAvoidtest time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The integrated testing apparatus enables continuous testing operations where the reference DAC continuously generates reference signals and the error detector continuously compares these with DAC under test outputs. This continuous operation eliminates idle time between measurements and maintains constant testing throughput

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The reference DAC is pre-configured with known accurate transfer characteristics before testing begins. This preliminary preparation of reference data allows the error detector to immediately perform accurate comparisons without requiring time-consuming calibration or setup during the actual testing process

Inventive Principle:
Principle #10Preliminary action

3Productivity

If multi-site testing capability is enhanced, then productivity increases, but device complexity and cost increase

Engineering Contradiction:
Improvetesting throughputVSAvoidmulti-site testing capability
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The integrated testing apparatus is designed as a universal device that can test multiple DAC channels simultaneously. The reference DAC can be configured to generate reference signals for different frequency ranges and the error detector can compare multiple channel pairs, enabling one apparatus to perform the work of multiple specialized testers

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The testing apparatus is segmented into independent functional modules: the reference DAC section, the error detector section, and the control section. This modular segmentation allows the same apparatus to be configured for different testing scenarios and enables parallel operation across multiple testing sites without requiring complex interconnections

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS7868794B2Methods and apparatus to test and compensate multi-channel digital-to-analog converters
Publication Date: 2011.01.11 TEXAS INSTRUMENTS INC
  • US7868794B2 patent drawing
  • US7868794B2 patent drawing
  • US7868794B2 patent drawing

AI summary

Methods and apparatus to test and compensate multi-channel digital-to-analog converters (DACs) are described. In some examples, a multi-channel digital-to-analog converter (DAC) and an error detector are implemented in an integrated circuit. The multi-channel DAC includes a first DAC channel configured to generate a first analog representation of a digital input signal, and a second DAC channel configured to generate a second analog representation of the digital input signal. The error detector is configured to compare the first analog representation and the second analog representation to generate a difference signal, and to output a signal indicative of whether the difference signal is greater than a predetermined threshold.