Multichannel Ground Fault Tester for Simultaneous Circuit Testing
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Solution Overview
Problem
Existing single-channel ground fault testers require manual testing of multiple circuits or nodes, making the process laborious, time-consuming, and costly, as they need to be disconnected and reconnected for each circuit, which is inefficient for applications with multiple isolated circuits.
Innovation Solution
A multichannel ground fault tester that can connect to multiple individual circuits simultaneously, allowing sequential or ordered testing without manual disconnection, utilizing a signal generator, current sensor, and multiple channels with relays to sense current levels and indicate isolation status, reducing the need for manual intervention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single-channel ground fault tester is used to test multiple circuits, then the device complexity is reduced, but the productivity and testing efficiency deteriorate due to manual disconnection and reconnection requirements
Solution Approach 1:
The device is divided into multiple independent channels, each capable of testing a separate circuit simultaneously. This segmentation allows parallel testing operations without requiring manual disconnection, thereby maintaining low overall device complexity while significantly improving productivity.
Solution Approach 2:
Each channel in the multichannel GFT is designed with universal functionality to test different circuits independently. This multi-functionality enables a single device to handle multiple testing tasks concurrently, resolving the contradiction between device simplicity and testing efficiency.
2Device complexity
If a single-channel ground fault tester is used for multiple circuits, then the device simplicity is maintained, but the loss of time increases due to manual reconnection requirements
Solution Approach 1:
By segmenting the testing capability into multiple channels within a single device, the patent eliminates the time-consuming manual disconnection and reconnection process while maintaining device simplicity. Each channel can test its assigned circuit independently and simultaneously.
3Productivity
If multiple single-channel testers are used to test multiple circuits simultaneously, then the productivity improves, but the device complexity and cost increase
Solution Approach 1:
The patent combines multiple single-channel testing functions into a single integrated multichannel device. This merging approach achieves the productivity benefits of simultaneous multi-circuit testing while reducing the overall system complexity and cost compared to using multiple separate single-channel testers.
Solution Approach 2:
The multichannel GFT provides universal testing capability across multiple channels within a single device, achieving high productivity without the complexity and cost of multiple separate devices. Each channel maintains independent functionality while sharing common device resources.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Automates the testing of multiple circuits, reducing labor time and costs by allowing simultaneous connection and sequential testing, while using high-precision components efficiently and ensuring proper operation through built-in self-testing.
Implementation Method 1
a signal generator adapted to output a test signal
Implementation Method 2
The current sensor is adapted to sense a level of a current flowing through each channel and its respective external circuit
Data Source
AI summary
A multichannel ground fault tester that can be connected to multiple individual circuits (or nodes isolated from each other within a circuit) at the same time. The circuits or nodes can be tested sequentially, or in any order, without manually disconnecting, moving and reconnecting the tester as is currently required when using a single-channel ground fault tester to test multiple circuits (or nodes isolated from each other within a circuit).