Multichannel Switch IC Common Test Terminal for Overcurrent Monitoring
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Solution Overview
Problem
Multichannel switch integrated circuits (ICs) face an increase in the number of test terminals, which complicates chip size and testing complexity due to the need for separate test terminals for each channel's overcurrent detection circuit, leading to a requirement for reducing the number of test terminals.
Innovation Solution
A multichannel switch IC design incorporating a common test terminal connected to each channel's overcurrent detection circuit through a diode, allowing detection currents from multiple channels to be monitored using a single test terminal, thereby reducing the overall number of test terminals required.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate test terminals are provided for each channel's overcurrent detection circuit, then each channel can be independently tested, but the number of test terminals increases and chip size becomes larger
Solution Approach 1:
The patent combines multiple separate test terminals into a single common test terminal that serves all channels. The common test terminal is connected to each channel's overcurrent detection circuit through diodes, allowing one terminal to perform testing functions for multiple channels simultaneously, thereby reducing the total number of test terminals and chip area.
Solution Approach 2:
The common test terminal is designed to serve multiple functions across different channels. By connecting the single test terminal to each channel's detection circuit through diodes, it enables universal testing capability for all channels, making the test terminal multi-functional rather than dedicated to a single channel.
2Reliability
If separate test terminals are provided for each channel's overcurrent detection circuit, then each channel can be independently tested, but testing complexity increases
Solution Approach 1:
The patent merges multiple test terminals into one common test terminal, which simplifies the testing process. Instead of requiring separate testing procedures for each terminal, the common test terminal can test all channels through the diode connections, reducing testing complexity while maintaining detection capability for each channel.
3Reliability
If separate test terminals are provided for each channel's overcurrent detection circuit, then each channel can be independently tested, but the number of test terminals increases
Solution Approach 1:
The patent combines multiple separate test terminals into a single common test terminal that serves all channels. This merging reduces the quantity of test terminals from multiple separate terminals to just one common terminal, while the diode connections ensure that each channel remains independently testable.
Solution Approach 2:
The common test terminal is designed with universal functionality to serve all channels. By connecting it to each channel's detection circuit through diodes, a single terminal performs the function of multiple terminals, reducing the total number required while maintaining comprehensive testing capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design effectively reduces the number of test terminals, minimizing increases in chip size and testing costs while maintaining the ability to monitor overcurrents across multiple channels, thus enhancing testing efficiency and reducing complexity.
Implementation Method 1
a diode having an anode that receives the detection current. The common test terminal is connected to each channel switch circuitry, connected to the overcurrent detection circuit through the diode, and connected to a cathode of the diode
Data Source
AI summary
According to one embodiment, a multichannel switch integrated circuit (IC) includes a multichannel switch circuit and a common test terminal. The multichannel switch circuit includes a plurality of switch circuitries. Each of the switch circuitries includes: an output transistor that outputs an output signal through an output terminal; an overcurrent detection circuit that detects a detection current according to a current flowing through the output transistor; and a diode having an anode that receives the detection current. The common test terminal is connected to each channel switch circuitry, connected to the overcurrent detection circuit through the diode, and connected to a cathode of the diode.