Multi-Channel Test Circuit With Functional Safety Module
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Solution Overview
Problem
Conventional test circuits are limited to single-channel testing and cannot meet the application requirement for processing multi-channel inputs in the field of image processing.
Innovation Solution
A test circuit, method, and apparatus for a to-be-tested module that includes a test data generation module with multiple units and a functional safety module, enabling the generation of test data consistent with various data types and performing check operation and fault injection processing to obtain multiple processing results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a conventional test circuit is used, then the testing process is simple, but it can only perform single-channel testing and cannot meet multi-channel input requirements
Solution Approach 1:
The test circuit is divided into multiple independent test data generation units, each capable of generating test data for a specific channel. This segmentation allows the circuit to handle multi-channel inputs while maintaining the simplicity of individual unit design, resolving the contradiction between versatility and complexity.
Solution Approach 2:
The test circuit incorporates a universal functional safety module that can process test data from multiple channels through the same check operation and fault injection processing mechanisms. This multi-functionality enables the circuit to adapt to multi-channel testing requirements without proportionally increasing overall system complexity.
2Adaptability or versatility
If multiple test data generation units are added to enable multi-channel testing, then the testing capability is improved, but the device complexity increases
Solution Approach 1:
Multiple test data generation units are merged into a single integrated test circuit architecture that shares common functional safety modules for check operation and fault injection processing. This combining approach enables multi-channel testing capability while avoiding the complexity that would result from completely separate testing systems for each channel.
Data Source
AI summary
Disclosed are a test circuit, method, and apparatus for a to-be-tested module. The circuit includes a test data generation module including a plurality of test data generation units, each of which is configured to generate test data consistent with a data type supported by itself based on raw data consistent with the data type; and a functional safety module electrically connected to the to-be-tested module and each test data generation unit; the functional safety module being configured to perform check operation processing on the test data to obtain a first processing result, and to perform check operation processing and fault injection processing on the test data to obtain a second processing result; and the to-be-tested module being configured to generate a test result based on test data, first processing result, and second processing result. Embodiments of this disclosure can achieve multi-channel testing, thereby satisfying application requirement for processing multi-channel inputs.