3D Contour Measurement With Multi-Frequency Structured Light
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Solution Overview
Problem
Existing three-dimensional measurement systems are susceptible to environmental factors such as ambient light intensity and hand movement, leading to inaccurate and unreliable measurement data.
Innovation Solution
A three-dimensional contour measurement system using a laser light source with high optical power, combined with a light source modulation unit that generates structured light with multiple frequencies, and a control device for phase information processing, to enhance measurement accuracy and stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a hand-held detector with a low-power light source is used for scanning, then the portability and ease of operation are improved, but the scanning light becomes unstable due to hand movement, reducing measurement reliability and repeatability
Solution Approach 1:
The patent changes the power parameter of the light source from low-power to high-power. This allows the system to maintain portability while achieving stable scanning results, as the high-power light source provides sufficient illumination even when hand movement occurs during scanning.
Solution Approach 2:
The patent employs periodic action through multiple repeated scans of the object. By performing several scans and analyzing all scanned data together, the system compensates for errors in individual scans, thereby improving measurement repeatability and reliability.
2Illumination intensity
If the light intensity of ambient light is strong, then the illumination of the measurement environment is improved, but the ambient light interferes with the formation of diffraction fringes, reducing measurement precision
Solution Approach 1:
The patent converts the harmful effect of strong ambient light into a beneficial feature. By using a high-power light source that can operate effectively in bright environments and by employing multiple scan repetitions, the system achieves accurate measurements even when ambient light intensity is high, thereby converting the previously harmful condition into an acceptable operating environment.
3Measurement precision
If repeated scanning is performed to improve measurement accuracy, then more data is collected, but the errors in each scan cannot be compensated, reducing the overall measurement precision
Solution Approach 1:
The patent implements feedback through the analysis of all scanned data. By collecting and analyzing data from multiple scans together, the system identifies and compensates for errors in individual scans, thereby improving overall measurement precision and preventing information loss.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves higher measurement accuracy and stability by compensating for environmental interference and hand movement, providing richer phase information and improved resolution in 3D contour reconstruction.
Implementation Method 1
the light source modulation unit is configured to modulate the light beam emitted by the light source unit into the structured light with a preset frequency
Implementation Method 2
a laser light source with high optical power
Data Source
AI summary
Disclosed in the present application is a three-dimensional (3D) contour measurement system. The 3D contour measurement system includes a light source unit, an image acquisition unit, and a control device. The light source unit emits light beam, the light source modulation unit modulates the light beam into a structured light with a preset frequency. The image acquisition unit acquires a stripe image of the object. The control device processes the stripe image to obtain a spectral image, obtains a first phase corresponding to a first structured light, a second phase corresponding to the second structured light, and an equivalent phase corresponding to the structured light based on the spectral region, and obtains a contour height of the object based on the first phase, the second phase, and the equivalent phase.