Multi-Frequency Test Signal for Electronic Device Characterization

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional electronic device testing methods are time-consuming and costly, requiring sequential frequency sweeps to measure bandwidth and frequency response, which limits testing speed and efficiency.

Innovation Solution

A test system and method utilizing a test signal with multiple frequency peaks, allowing simultaneous measurement and analysis of frequency response across various frequencies, enabling faster and more accurate testing without reducing quality, and potentially enabling real-time testing and development.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a sequential frequency sweep method is used to measure bandwidth and frequency response, then measurement precision is maintained, but testing time increases significantly

Engineering Contradiction:
Improvefrequency response measurement accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent segments the frequency spectrum into multiple discrete frequency peaks within a single test signal. Instead of sweeping through frequencies sequentially, the test signal contains multiple frequency components (e.g., 10-100 different frequencies) simultaneously, allowing parallel measurement of frequency response at all these frequencies in one go, thus dramatically reducing testing time while maintaining precision through sufficient frequency resolution

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs periodic test signals with specific repetition frequencies that create distinct frequency peaks in the frequency domain. By carefully selecting the repetition frequency and duty cycle of the periodic signal, multiple frequency components are generated that can be used to probe the device under test across a broad frequency range, enabling efficient bandwidth measurement without sequential sweeping

Inventive Principle:
Principle #19Periodic action

2Measurement precision

If multiple frequency points are measured sequentially to ensure comprehensive frequency response analysis, then measurement completeness is improved, but productivity decreases

Engineering Contradiction:
Improvefrequency response completenessVSAvoidtesting speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent merges multiple frequency measurements into a single test signal by combining multiple sinusoidal components or using a periodic signal with rich harmonic content. This allows the measurement system to capture frequency response information at multiple frequency points simultaneously in one measurement cycle, improving both completeness and productivity by eliminating the need for repeated sequential measurements

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If a broad frequency range is tested with sufficient measuring values, then frequency response accuracy is improved, but the complexity of the testing process increases

Engineering Contradiction:
Improvefrequency response accuracyVSAvoidtesting process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent changes the parameter of the test signal from a single-frequency continuous wave to a multi-frequency periodic signal or composite signal with controllable spectral characteristics. By adjusting the repetition frequency, duty cycle, and pulse width of the periodic signal, the spectral distribution and spacing of frequency peaks can be optimized to match the device under test's frequency range of interest, achieving accurate frequency response measurement across broad ranges while keeping the signal generation and analysis relatively simple

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10914782B2Test system and test method for testing a device under test
Publication Date: 2021.02.09 ROHDE & SCHWARZ GMBH & CO KG
  • US10914782B2 patent drawing
  • US10914782B2 patent drawing
  • US10914782B2 patent drawing

AI summary

The present invention relates to a test system for testing a device under test, comprising a signal generating unit being connectable to an input node of the device under test and being adapted to generate a test signal to be applied to the input node of the device under test, wherein the test signal comprises a plurality of frequency peaks at different frequencies. A receiving unit is connectable to an output node of the device under test and is adapted to receive a response signal from the device under test in response to the test signal. An analyzing unit for analyzing the device under test is adapted to determine at least one of a gain value and a phase value based on the test signal generated by the signal generating unit and the response signal received by the receiving unit.