Multi-Laser Surface Profiler for Short-Wavelength Feature Detection
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Solution Overview
Problem
Current surface profilers, especially low-speed contact-based manual profilers, face challenges in accurately measuring short wavelength profile features due to limitations in inclinometer-based configurations and the integration of non-contact sensors, leading to errors and reduced spectral detail in surface profiles.
Innovation Solution
A surface profiling apparatus with a frame supported on wheels, equipped with multiple optical triangulation lasers and an inclinometer, measures surface profiles continuously using differential calculations to compute elevations at small increments, allowing for accurate detection of features smaller than the wheelbase, and incorporates a longitudinal distance measuring apparatus and transverse inclination measuring apparatus to correct cross-axis errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If inclinometer-based configurations are used in low-speed contact-based manual profilers, then the profiler can measure surface profiles, but it cannot accurately detect short wavelength profile features due to integration errors and drift
Solution Approach 1:
The patent divides the measurement system into multiple independent sensing points (multiple vertical distance measuring devices spaced apart) rather than relying on a single inclinometer measurement. This segmentation allows direct measurement of elevation differences at multiple locations, eliminating the need for double integration of accelerometer signals and preventing error accumulation over time.
Solution Approach 2:
The patent replaces the mechanical/inertial measurement system (accelerometers and inclinometers that require double integration) with optical measurement devices (lasers, cameras, or other optical triangulation systems) that directly measure vertical distances. This substitution eliminates integration errors and drift inherent in inertial systems, providing reliable measurements over long durations.
2Measurement precision
If the profiler uses wheels with a certain wheelbase distance, then it can be supported stably, but it cannot measure features smaller than the wheelbase distance due to sampling limitations
Solution Approach 1:
The patent adds a vertical dimension to the measurement system by placing multiple vertical distance measuring devices at different horizontal positions but all measuring in the vertical direction. This creates a multi-point vertical measurement array that can detect short wavelength features between the wheels by measuring elevation differences at multiple discrete points along the wheelbase.
Solution Approach 2:
Instead of using the wheelbase distance as the sampling interval (as in traditional profilers), the patent inverts the approach by placing multiple measurement devices within the wheelbase distance. This allows measurement of features smaller than the wheelbase by taking multiple samples between the wheel contact points, effectively measuring at a resolution finer than the mechanical support structure.
3Measurement precision
If non-contact sensors are integrated with inclinometer-based configurations, then surface profiles can be measured, but cross-axis errors and reduced spectral detail occur
Solution Approach 1:
The patent merges multiple vertical distance measuring devices into a single integrated measurement system that works in conjunction with the inclinometer. By combining the absolute vertical distance measurements from the optical devices with the angular measurements from the inclinometer, the system achieves accurate surface profiling without cross-axis errors, as all measurements are referenced to a common coordinate system.
Solution Approach 2:
The patent uses the inclinometer as an intermediary to transform the measurements from the vertical distance measuring devices into a common reference frame. The inclinometer provides the orientation information needed to correct for frame tilting, allowing the vertical distance measurements to be accurately referenced to the horizontal plane without suffering from cross-axis errors.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus achieves high-resolution surface profiling capable of accurately measuring short wavelength features, improving the accuracy and repeatability of surface profile data, making it suitable for contract management and certification of other instruments.
Implementation Method 1
equipped with multiple optical triangulation lasers
Data Source
AI summary
A surface profiler including at least one front support wheel and at least one rear support wheel for travelling along the surface of a profile to be measured, the rotational axes of said wheels being longitudinally spaced, and the wheels contacting the surface being profiled in a collinear manner. A frame carried on the wheels carries at least one inclinometer and at least two vertical distance measuring apparatus such as lasers, and may also carry an optical encoder. The lasers are collinear with each other and with the wheels. Incremental to measurements of inclination angles provided by the inclinometer, together with incremental measurements of distance to the surface being measured provided by the lasers, produce a continuous, high resolution mathematical series of elevations representing the surface profile, including reproduction of surface features that are smaller than the distance between the wheels.