Multilayer Capacitor Composition for Crack-Free Electrode Connection
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Solution Overview
Problem
Existing multilayer capacitors face challenges in suppressing the occurrence of cracks in the element body, ensuring reliable connections between external and internal electrode terminals, and maintaining desired electrical characteristics.
Innovation Solution
The multilayer capacitor design includes a configuration where the dielectric and internal electrode layers are alternately laminated, with internal electrode layers exposed at the end surfaces and connected to external electrode terminals. The weight ratio of metal containing Ni is between 20% to 25%, and the sulfur content is between 3 ppm to 20 ppm, optimizing the content ratios to enhance connection reliability and suppress cracking.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the amount of sulfur in the element body is increased to make internal electrode layers protrude from dielectric layers, then connection reliability between external electrode terminal and internal electrode layer is improved, but cracks may occur in the element body
Solution Approach 1:
The patent applies parameter changes by precisely controlling the sulfur content within the range of 3 ppm to 20 ppm and metal content within 20% to 25% by weight. This optimization resolves the contradiction by finding the optimal parameter range where internal electrode layers sufficiently protrude for reliable external electrode connection while preventing excessive sulfur from causing element body cracks.
Solution Approach 2:
The patent uses composite materials by combining specific ratios of metal (20%-25% by weight) and sulfur (3 ppm to 20 ppm) within the dielectric and electrode layers. This composite approach allows the internal electrode layers to protrude adequately for connection reliability while the controlled composite structure prevents crack formation in the element body.
2Reliability
If the amount of metal is increased to secure capacitance per volume, then electrical characteristics are improved, but cracks may occur in the element body
Solution Approach 1:
The patent applies parameter changes by optimizing the metal content to within 20% to 25% by weight. This parameter optimization ensures sufficient capacitance per volume through adequate metal content while preventing element body cracks that would occur with excessive metal content, thus resolving the contradiction between electrical performance and structural integrity.
3Reliability
If internal electrode layers are made to protrude from dielectric layers to improve connection reliability, then connection between external electrode terminal and internal electrode layer is improved, but manufacturing complexity increases
Solution Approach 1:
The patent resolves the contradiction by changing the chemical composition parameters (sulfur: 3 ppm to 20 ppm, metal: 20%-25% by weight) rather than modifying the structural geometry. This approach achieves the required internal electrode layer protrusion for reliable connection through compositional control during manufacturing, avoiding the need for complex post-processing or specialized molding techniques.
Data Source
AI summary
In an element body of a multilayer capacitor C1, a plurality of dielectric layers and a plurality of internal electrode layers extend in a first and second direction orthogonal to each other, and the plurality of dielectric layers and the plurality of internal electrode layers are alternately laminated in a third direction intersecting the first direction and second direction. The element body includes at least one end surface. At least one internal electrode layer among the plurality of internal electrode layers is exposed from the plurality of dielectric layers at at least one end surface. The external electrode terminal is provided on the at least one end surface and is connected to the at least one internal electrode layer. In the element body, a weight ratio of a metal containing Ni is from 20% to 25%, and a weight ratio of sulfur is from 3 ppm to 20 ppm.