Multilayer Conductive Posts for Void-Free Electronic Packaging
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Solution Overview
Problem
Conventional semiconductor packages face issues such as void formation due to size variation and unevenness in lasered holes, leading to poor yield, and conductive posts made of single materials suffer from thermal expansion mismatch and poor electrical properties in high temperature or high frequency environments.
Innovation Solution
The use of multilayer composite materials for conductive posts, comprising layers of cobalt, copper, and optionally a dielectric fill material, formed through existing processes and machinery to ensure uniform dimensions and flat side walls, preventing voids and improving CTE matching and electrical conductivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If conventional electroplated copper post method is used, then manufacturing process is simple, but voids are easily formed due to size variation and unevenness of lasered holes
Solution Approach 1:
The patent applies preliminary action by forming a planarization layer before forming the conductive posts. This planarization layer pre-compensates for the unevenness of the lasered holes, providing a uniform base surface for subsequent electroplating. This preliminary intervention ensures that the conductive posts formed later have uniform dimensions and flat side walls, preventing void formation while maintaining the simplicity of the electroplating process.
2Ease of manufacture
If single material conductive posts are used, then manufacturing process is simple, but CTE mismatch and poor electrical properties occur in high temperature or high frequency environments
Solution Approach 1:
The patent applies composite materials by constructing conductive posts with multiple material layers: a copper layer for electrical conductivity, a cobalt layer for CTE matching and barrier properties, and optionally a dielectric fill material for structural stability. This multi-layer composite structure simultaneously achieves good electrical properties, matched CTE, and prevention of copper migration, resolving the reliability issues of single-material posts while extending the manufacturing process in a controlled manner.
3Reliability
If multilayer composite materials are used for conductive posts, then CTE matching and electrical conductivity are improved, but manufacturing process complexity increases
Solution Approach 1:
The patent uses preliminary action by forming a planarization layer before depositing the multilayer composite structure. This preliminary step creates a uniform surface that simplifies subsequent layer deposition, ensuring consistent thickness and composition of the copper, cobalt, and dielectric layers. This approach reduces manufacturing variability and makes the complex multilayer process more controllable and repeatable.
Solution Approach 2:
The patent applies parameter changes by carefully controlling the thickness parameters of each layer in the composite structure. The copper layer thickness is optimized for electrical conductivity, the cobalt layer thickness is controlled for CTE matching and barrier function, and the dielectric fill material thickness is adjusted for structural stability. By optimizing these parameters, the patent achieves high reliability while keeping the manufacturing process manageable through precise but not excessive complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances product yield by preventing void formation and improving electrical conductivity, while maintaining compatibility with existing manufacturing infrastructure without significant cost increases.
Implementation Method 1
the conductive posts 13 are formed by conventional electroplated copper post method
Implementation Method 2
the conductive posts 13 made of a single material are prone to have mismatch in coefficient of thermal expansion (CTE)
Data Source
AI summary
An electronic package is provided. A plurality of conductive posts with multilayer composite materials and at least one electronic component are disposed on a carrier structure. An encapsulation layer covers the at least one electronic component and the plurality of conductive posts. A circuit structure is disposed on the encapsulation layer and is electrically connected to the plurality of conductive posts. Therefore, the multilayer composite materials for the conductive posts achieve CTE (coefficient of thermal expansion) matching, improve electrical conductivity, and prevent copper diffusion in high temperature or high frequency working environments. A manufacturing method of the electronic package is also provided.


