Multi-layered Electronic Device with Through-Hole Interconnects

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Solution Overview

Problem

Existing wearable and implantable electronic devices face challenges in efficiently connecting multiple components and maintaining robust electrical connections, especially in compact configurations, while also requiring flexibility and resistance to mechanical stresses.

Innovation Solution

The development of multi-layered electronic devices comprising stacked metal conducting layers with dielectric and insulating layers, along with electrical connections through holes, allows for efficient connection and flexible configurations, using materials like gold, platinum, or carbon nanotube ink, and is scalable to withstand mechanical forces and maintain impedance for signal transmission.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple metal conducting layers are stacked to improve connection efficiency, then the device complexity increases, but the manufacturing precision becomes more difficult to maintain

Engineering Contradiction:
Improveconnection efficiencyVSAvoidalignment precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The device is divided into multiple discrete conducting layers separated by dielectric layers, with each layer being independently formed. This segmentation allows for standardized layer thicknesses (e.g., 10-50 μm for conducting layers, 5-20 μm for dielectric layers) and systematic formation processes, improving manufacturing precision while maintaining connection efficiency through the multi-layer architecture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple conducting layers are nested within dielectric layers in a stacked configuration, with each layer contained within its own dielectric enclosure. This nesting approach provides precise spatial definition for each layer, ensuring consistent spacing and alignment through controlled dielectric layer thickness, thereby maintaining manufacturing precision as the device scales to multiple layers.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Area of stationary object

If the device is made compact to improve wearability, then the area is reduced, but the electrical connection robustness deteriorates

Engineering Contradiction:
Improvedevice areaVSAvoidconnection robustness
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The device transitions from a two-dimensional planar layout to a three-dimensional stacked architecture, stacking multiple conducting layers vertically within the dielectric matrix. This dimensional change allows the device to maintain a compact footprint while achieving robust electrical connections through multiple vertically-stacked conductive paths, effectively decoupling device area from connection robustness.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Adaptability or versatility

If flexible materials are used to improve adaptability, then the mechanical strength decreases, but the device can withstand mechanical stresses better

Engineering Contradiction:
ImproveflexibilityVSAvoidmechanical strength
Core Design Contradiction:
Adaptability or versatilityVSStrength

Solution Approach 1:

The device employs a composite structure combining flexible conducting layers (e.g., thin metal films or conductive polymers) with mechanically robust dielectric layers. This composite architecture provides flexibility through the thin conducting layers while the dielectric layers contribute mechanical strength and structural integrity, allowing the device to withstand bending and stretching stresses that would otherwise compromise flexible materials alone.

Inventive Principle:
Principle #40Composite materials

4Reliability

If through holes are created in dielectric layers to establish electrical connections, then the manufacturing complexity increases, but the electrical conductivity improves

Engineering Contradiction:
Improveelectrical conductivityVSAvoidmanufacturing complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Through holes are formed in the dielectric layers during the manufacturing process before final assembly, allowing conductive elements to be pre-positioned and connected between layers. This preliminary formation of connection pathways simplifies subsequent assembly steps and ensures precise alignment of electrical connections, reducing overall manufacturing complexity while achieving reliable inter-layer conductivity.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11089676B2Multi-layered fabrication processing
Publication Date: 2021.08.10 THE CHARLES STARK DRAPER LABORATORY INC
  • US11089676B2 patent drawing
  • US11089676B2 patent drawing
  • US11089676B2 patent drawing

AI summary

A multi-layered electronic device including two or more stacked metal conducting layers, a dielectric layer disposed between metal conducting layers, and at least one electrical connection extending between contact pads of metal conducting layers and through a through hole of the dielectric layer is provided. A system including at least one multi-layered electronic device, a satellite coupled to at least one multi-layered electronic device, and a controller hub electrically connected to the multi-layered electronic device via the satellite is also provided. A method of manufacturing the multi-layered electronic device including forming first and second first metal conducting layers, depositing a dielectric layer adjacent to the metal conducting layers, and connecting the metal conducting layers is also provided.