Multilayer Optic Device for High-Energy X-Ray Flux Density
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing optic devices used in X-ray imaging systems, such as those for explosives detection and medical imaging, suffer from low X-ray flux density due to inefficient collection and redirection of electromagnetic radiation, particularly at energy levels above 60 keV, and are limited by the use of air as a high refractive index material which prevents operation in vacuum environments.
Innovation Solution
The development of a multilayer optic device utilizing total internal reflection with conformal solid phase layers and photon redirection regions, allowing for increased photon transmission and operation in vacuum environments by selecting materials with varying indices of refraction to enhance the critical angle for total internal reflection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If hollow glass polycapillary optics are used to collect and redirect X-rays, then X-ray flux density is improved at energies below 60 keV, but the device cannot operate in vacuum environments due to air filling the hollow portions
Solution Approach 1:
The patent changes the physical state of the high refractive index material from gas (air) to solid phase, enabling the optic to operate in vacuum environments while maintaining its X-ray redirection capability. This parameter change resolves the contradiction between achieving high X-ray flux density and being able to operate in vacuum.
Solution Approach 2:
The patent employs a composite structure with a solid core surrounded by conformal solid phase layers, where each layer has specific refractive index properties. This composite material approach allows the optic to function in vacuum while achieving effective X-ray collection and redirection, resolving the limitation of air-filled hollow structures.
2Illumination intensity
If air is used as the high refractive index material in polycapillary optics, then the critical angle for total internal reflection is sufficient for X-ray redirection, but the optic cannot be placed within a vacuum
Solution Approach 1:
The patent changes the refractive index material from air (gas phase) to solid phase materials with appropriate refractive indices. This parameter change maintains the critical angle necessary for total internal reflection while enabling vacuum operation, resolving the contradiction between X-ray redirection efficiency and vacuum compatibility.
3Quantity of substance
If conventional optics are used to collect electromagnetic radiation, then only about five percent of the source solid angle is captured, but increasing the collection angle would require optics that cannot function at high energy levels above 60 keV
Solution Approach 1:
The patent uses a composite structure of solid phase layers with different refractive indices to achieve effective X-ray collection and redirection at high energy levels. This composite material approach enables capture of a larger solid angle while maintaining sufficient X-ray flux density at energies above 60 keV, resolving the contradiction between collection angle and high energy performance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution significantly increases the X-ray flux density at the output, achieving up to 5000 times greater intensity than conventional optics, while enabling operation in vacuum environments and effective use at high energy levels, thereby improving imaging quality and expanding application possibilities.
Implementation Method 1
The optic device utilizes total internal reflection to redirect the X-rays at an energy level above about sixty keV
Data Source
AI summary
An optic device, system and method for imaging are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a second photon transmission property, the solid phase layers being situated between an output face and a non-flat input face. The first and second layers are conformal to each other. The imaging system includes a source of electrons and a target, with an array of the optic devices coupled thereto to form limited cone beams of X-ray radiation.