Multilayer Device for Optical and Microwave Reflection
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Solution Overview
Problem
Existing multilayer devices fail to provide a robust, inexpensive, and compact solution for selectively reflecting electromagnetic radiation across various wavelength ranges, including optical and microwave regimes, limiting their functionality in applications such as range finding and spatial guidance.
Innovation Solution
A multilayer device with spatially collocated optical and microwave reflecting arrangements, utilizing a dielectric glass slab with a microwave transistor to modulate conductivity and achieve high reflection coefficients across 230 nm to 800 nm and 30 mm to 1 mm wavelength ranges, respectively, allowing for selective reflection based on polarization and angle of incidence.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate optical and microwave reflectors are used, then each wavelength range can be reflected effectively, but the device becomes complex, large, and expensive
Solution Approach 1:
The patent combines optical and microwave reflecting arrangements into a single spatially collocated multilayer device. The optical reflecting arrangement (with high reflectivity for 230-800 nm wavelengths) and microwave reflecting arrangement (with high reflectivity for 30 mm-1 mm wavelengths) are integrated into one device structure, eliminating the need for separate reflectors and reducing overall system complexity.
Solution Approach 2:
The multilayer device performs multiple functions simultaneously: it reflects both optical radiation (230-800 nm) and microwave radiation (30 mm-1 mm) with high reflection coefficients. This multi-functional design allows a single device to serve purposes that previously required separate optical and microwave components.
2Adaptability or versatility
If multiple separate reflectors are deployed, then comprehensive wavelength coverage is achieved, but the device size and manufacturing cost increase
Solution Approach 1:
The patent integrates optical and microwave reflecting arrangements into a single manufactured unit. The multilayer structure combines materials and designs that work across both optical (230-800 nm) and microwave (30 mm-1 mm) wavelength ranges, allowing comprehensive wavelength coverage through one manufacturing process rather than assembling multiple separate components.
3Reliability
If a robust multilayer device is created, then reliability improves, but device complexity and cost increase
Solution Approach 1:
The multilayer device is segmented into distinct functional arrangements: an optical reflecting arrangement with specific layers optimized for optical wavelengths (230-800 nm) and a microwave reflecting arrangement with layers optimized for microwave wavelengths (30 mm-1 mm). Each segment is designed independently for its wavelength range but is integrated into a single robust multilayer structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The multilayer device enhances visibility and functionality by providing high reflection coefficients (>0.7) across multiple wavelengths, making it suitable for applications like autonomous vehicle guidance and vehicle radar systems, while being robust and cost-effective.
Implementation Method 1
an optical reflecting arrangement that reflects, according to a first reflection coefficient, electromagnetic radiation having a wavelength in a range of 230 nanometre (nm) to 800 nm
Implementation Method 2
a microwave reflecting arrangement that reflects, according to a second reflection coefficient, electromagnetic radiation having a wavelength in a range of 30 millimetre (mm) to 1 mm
Implementation Method 3
utilizing a dielectric glass slab with a microwave transistor to modulate conductivity and achieve high reflection coefficients
Data Source
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AI summary
There is disclosed a multilayer device that reflects at least a portion of electromagnetic radiation received thereat, when in operation, characterized in that the multilayer device includes: an optical reflecting arrangement (102) that reflects, according to a first reflection coefficient, electromagnetic radiation having a wavelength in a range of 230 nanometre (nm) to 800 nm; and a microwave reflecting arrangement (104) that reflects, according to a second reflection coefficient, electromagnetic radiation having a wavelength in a range of 30 millimetre (mm) to 1 mm, wherein the optical reflecting arrangement and the microwave reflecting arrangement are spatially collocated as one or more layers of the multilayer device.