Multi-Layer Silicon X-Ray Optic for 3D Focusing

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Solution Overview

Problem

Existing x-ray optics, particularly those using curved crystals, struggle to achieve high-intensity, small beam spot sizes and efficient monochromatization, limiting the spatial resolution and quality of x-ray analysis measurements, especially with small, low-power x-ray sources.

Innovation Solution

The development of an x-ray optic with multiple layers of silicon, each with a predetermined crystalline orientation, bonded using silicon-on-insulator or adhesive techniques, providing a diffractive effect and forming a curved, monochromating optic that enhances focusing and monochromatization capabilities.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If curved crystals are used for x-ray focusing, then focusing capability is improved, but beam spot size and intensity are limited

Engineering Contradiction:
Improvefocusing capabilityVSAvoidbeam spot size
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The optic is divided into multiple layers (at least two layers) with different crystalline orientations, where each layer contributes to focusing in different planes. This segmentation allows the optic to achieve point-to-point focusing in three dimensions by combining the focusing effects of individual layers with different orientations.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention uses a composite structure combining multiple crystal layers with different orientations bonded together. This composite approach integrates the focusing capabilities of differently oriented crystals into a single optic element, achieving superior three-dimensional focusing that neither single-layer crystal could provide alone.

Inventive Principle:
Principle #40Composite materials

2Productivity

If singly-curved crystals are used, then two-dimensional focusing is achieved, but three-dimensional focusing is not provided

Engineering Contradiction:
Improvefocusing efficiencyVSAvoiddimensional focusing capability
Core Design Contradiction:
ProductivityVSAdaptability or versatility

Solution Approach 1:

The invention transitions from two-dimensional focusing (singly-curved) to three-dimensional focusing (doubly-curved) by adding another dimensional component through multiple layers with different orientations. Each layer provides focusing in a different plane, and their combination achieves complete three-dimensional point-to-point focusing.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Illumination intensity

If expensive powerful x-ray sources are used, then high beam intensity is achieved, but system cost increases

Engineering Contradiction:
Improvex-ray beam intensityVSAvoidsystem cost
Core Design Contradiction:
Illumination intensityVSDevice complexity

Solution Approach 1:

The invention changes the parameters of the optic itself (multiple layers with specific crystalline orientations) to achieve high beam intensity through improved focusing efficiency. This allows the use of less powerful, more inexpensive x-ray sources while still achieving the same beam intensity that would otherwise require expensive high-power sources.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution increases the efficiency and sensitivity of x-ray focusing, allowing for higher intensity x-ray beams with smaller beam spot sizes, improving spatial resolution and signal-to-background ratio, and enabling more effective x-ray analysis with smaller, less expensive x-ray sources.

Implementation Method 1

Monochromatization of x-ray beams in the excitation and/or detection paths is also useful. One existing x-ray monochromatization technology is based on diffraction of x-rays on optical crystals, for example, germanium (Ge) or silicon (Si) crystals. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays.

Methodology Applied
Scientific EffectX-ray diffraction: Bragg Diffraction

Data Source

PatentUS7738629B2X-ray focusing optic having multiple layers with respective crystal orientations
Publication Date: 2010.06.15 X RAY OPTICAL SYSTEMS INC
  • US7738629B2 patent drawing
  • US7738629B2 patent drawing
  • US7738629B2 patent drawing

AI summary

A diffracting x-ray optic for accepting and redirecting x-rays. The optic includes at least two layers, the layers having a similar or differing material composition and similar or differing crystalline orientation. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays. In one embodiment, the layers are silicon, and are bonded together using a silicon-on-insulator bonding technique. In another embodiment, an adhesive bonding technique may be used. The optic may be a curved, monochromating optic.