Multi-Plane Calibration Target for Precise FPM Illumination Angles
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Solution Overview
Problem
Existing Fourier Ptychography Microscopy (FPM) systems face challenges in accurately calibrating illumination due to manufacturing errors in mechanical designs of calibration structures, limiting the precision of high-resolution image reconstruction.
Innovation Solution
A calibration target with parallel planes containing predefined calibration structures, allowing for precise centering and determination of illumination angles using an array of LEDs and a camera, to determine illumination angles, and a method for calibrating a Fourier ptychographic imaging system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If binary single-layer planar objects with test structures are used for calibration, then the calibration process is simple, but the measurement precision of illumination angles is insufficient
Solution Approach 1:
The calibration target is divided into multiple parallel planes (at least two), each containing different calibration structures. The first plane has structures for centering alignment, while the second plane has structures for determining characteristic positions. This segmentation allows each plane to serve a specific calibration function, improving overall measurement precision without overwhelming complexity.
Solution Approach 2:
The calibration target extends from a single-layer planar structure to a multi-layer three-dimensional structure with predefined distances between planes. This dimensional change enables more sophisticated calibration functionality by utilizing depth information and multiple viewing angles, thereby improving illumination angle determination precision.
2Manufacturing precision
If traditional calibration structures are used, then the calibration process is straightforward, but the alignment accuracy between calibration structures and imaging system is insufficient
Solution Approach 1:
Different calibration structures are placed on separate planes: the first plane contains structures specifically designed for centering alignment with the imaging system, while the second plane contains structures for determining characteristic positions. This functional segmentation improves alignment accuracy by dedicating specific structures to specific alignment tasks.
Solution Approach 2:
The first calibration structure on the first plane serves as an intermediary element that facilitates precise centering alignment between the calibration target and the imaging system. This intermediary structure simplifies the alignment operation by providing a clear reference point for centering, while the second calibration structure on the second plane provides additional reference information for determining characteristic positions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate calibration of illumination angles and improves the quality of reconstructed images by determining the effective illumination angles and enhancing the quality of the reconstruction process.
Implementation Method 1
From the diffraction patterns of the light beams after passing through the object, the azimuthal direction of illumination can also be determined.
Data Source
AI summary
The invention relates to a calibration target for a Fourier ptychographic imaging system, comprising at least a first plane and a second plane, wherein the first plane and the second plane are parallel to each other and comprise a predefined distance between each other, wherein the first plane comprises a first calibration structure and the second plane comprises a second calibration structure, wherein the first calibration structure is configured to be suitable for centering itself in relation to an optical component and/or a camera of the Fourier ptychographic imaging system, and wherein the second calibration structure is configured to be suitable for determining, directly or in projection onto the first plane, a position of at least one characteristic or predetermined feature of the first calibration structure.