Multi-Plane Memory Trim Registers for Plane-Specific Voltage Shifts

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Solution Overview

Problem

Existing memory sub-systems face increased bit error rates and latency due to the slow charge loss phenomenon, which causes varying voltage shifts across memory planes during multi-plane operations, leading to inefficient resource consumption and error correction.

Innovation Solution

Allocate distinct sets of registers for each memory plane to store trim values corresponding to individual voltage shifts, allowing the controller to perform multi-plane operations with appropriate trim values, reducing bit error rates and resource consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If multi-plane operations are performed using shared trim values, then device complexity is reduced, but bit error rate increases due to varying voltage shifts across planes

Engineering Contradiction:
Improveregister allocation complexityVSAvoidbit error rate
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent segments the trim value storage by allocating distinct register sets to each memory plane. Each plane's trim register set stores plane-specific trim values that compensate for that plane's unique voltage shifts, thereby reducing bit error rates while maintaining manageable complexity through systematic organization

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by using plane-specific trim values stored in dedicated registers for each plane. This allows each plane to have customized trim values tailored to its specific voltage characteristics, improving reliability without requiring a complete system redesign

Inventive Principle:
Principle #3Local quality

2Reliability

If plane-specific trim values are used, then bit error rate decreases, but device complexity increases due to multiple register sets

Engineering Contradiction:
Improvebit error rateVSAvoidregister allocation complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent organizes multiple trim register sets in a segmented manner, with each set dedicated to a specific plane. This systematic segmentation makes the complexity manageable and allows for efficient address mapping, reducing the practical burden of having multiple registers while maintaining the reliability benefits

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements a universal trim register structure where each plane has an identical register layout and access mechanism. This multi-functionality allows the same register interface to serve multiple planes, reducing control logic complexity while still providing plane-specific trim values

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of manufacture

If traditional single-set trim values are used for all planes, then manufacturing simplicity is maintained, but latency increases due to additional error correction operations

Engineering Contradiction:
Improvetrim value implementation simplicityVSAvoidoperation latency
Core Design Contradiction:
Ease of manufactureVSLoss of time

Solution Approach 1:

The patent performs preliminary action by pre-calculating and storing plane-specific trim values in dedicated registers before multi-plane operations execute. This preparation eliminates the need for runtime error correction, reducing latency while the systematic register allocation keeps manufacturing complexity manageable

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12474861B2Trim values for multi-plane operations
Publication Date: 2025.11.18 MICRON TECHNOLOGY INC
  • US12474861B2 patent drawing
  • US12474861B2 patent drawing
  • US12474861B2 patent drawing

AI summary

A request is received to perform a multi-plane operation for first data of a first plane and second data of a second plane of a memory device. Responsive to the request, first trim values are retrieved from first trim registers and second trim values are retrieved from second trim registers, the first trim values loaded to the first registers based on a first voltage distribution observed at the first plane during a first time period and the second trim values loaded to the second registers based on a second voltage distribution observed at the second plane during a second time period. The multi-plane operation is performed using at least the first trim values for the first data at the first plane and at least the second trim values for the second data at the second plane.