Multiple-Channel 3D Surface Localization Through Pattern Multiplexing

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Solution Overview

Problem

Existing three-dimensional surface measurement techniques face challenges in achieving high-speed, robust, and accurate measurements of objects under varying lighting conditions and in vibration-prone environments, particularly for mobile devices, due to limitations in pattern projection and image acquisition technologies.

Innovation Solution

Implementing multiple-channel pattern projection and imaging architectures that utilize time, spectrum, and polarization multiplexing to parallelize pattern projection and image acquisition, enabling high-speed, low-power, and compact systems suitable for integration into mobile devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If wide-field structured illumination approaches are used for three-dimensional surface measurement, then measurement speed is improved, but robustness against optical noise, electronic noise, pattern distortion, object reflectivity variations, and lighting variations deteriorates

Engineering Contradiction:

Improvemeasurement speedVSAvoidrobustness against noise and variations

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

The patent applies parameter changes by using multiple radiation patterns with different spatial frequencies and orientations. The system projects patterns with varying parameters (frequency, orientation, amplitude) onto the object surface, and the processor analyzes the deformed patterns across multiple frequencies to robustly determine surface location independent of noise and lighting variations.

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The patent segments the measurement process by dividing the object surface into multiple locations and measuring each location independently using location-independent algorithms. Each location is analyzed separately based on its own pattern deformation characteristics, avoiding dependency on neighboring locations and enabling parallel processing for high-speed measurement.

Inventive Principle:

Principle #1Segmentation

2Measurement precision

If pixel-dependent algorithms are used for pattern decoding, then measurement accuracy may be improved under ideal conditions, but applicability to objects with discontinuities, shadowing, and texture variations deteriorates

Engineering Contradiction:

Improvepattern decoding accuracyVSAvoidapplicability to diverse objects

Core Design Contradiction:

Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent inverts the traditional approach by using location-independent algorithms instead of location-dependent ones. Rather than determining the 3D location of a point based on its relationship to neighboring points, the system determines each location independently by analyzing the deformation of illumination patterns at that specific location, making the measurement process more adaptable to diverse object surfaces.

Inventive Principle:

Principle #13The other way round (Inversion)

3Productivity

If multiple-channel pattern projection and imaging architectures are implemented, then measurement speed and robustness are improved, but device complexity increases

Engineering Contradiction:

Improvemeasurement speedVSAvoidsystem architecture complexity

Core Design Contradiction:

ProductivityVSDevice complexity

Solution Approach 1:

The patent applies universality by designing a multiple-channel pattern projection system where a single projector can generate multiple radiation patterns with different spatial frequencies and orientations. The same projector and camera system handles multiple measurement functions by varying the projected patterns, reducing the need for multiple separate hardware components while achieving high-speed, robust measurements.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables robust, high-speed three-dimensional surface shape measurement capable of capturing single-shot events and operating in vibration-prone environments, with improved accuracy and reduced power consumption, suitable for consumer applications and robotics.

Implementation Method 1

a radiation source is provided that projects multiple radiation patterns onto an object by spatially modulating a radiation with a distinct combination of one or more modulating structures for each radiation pattern

Methodology Applied

Scientific EffectLight: Light

Implementation Method 2

spatially modulating a radiation with a distinct combination of one or more modulating structures

Methodology Applied

Scientific EffectDiffraction: Diffraction

Data Source

PatentUS12435968B2Multiple channel locating

Publication Date: 2025.10.07 COGNEX CORP

AI summary

Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.