Multiple Contact Pogo Pin for Dense Circuit Assembly
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Solution Overview
Problem
Existing spring probes require a minimum pitch between each adjacent probe, which can increase the size of electrical assemblies due to center-to-center spacing, making it challenging to make electrical connections in densely packed electronic devices where space is limited.
Innovation Solution
A multiple contact probe design that includes a barrel with electrically isolated contact interfaces and a plunger assembly with multiple electrical contacts, allowing for simultaneous communication of multiple signals while reducing the overall size by allowing the plunger assembly to telescope between extended and retracted configurations, and utilizing a bias element to maintain contact alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing spring probes are used with minimum pitch spacing, then reliable electrical contact is achieved, but the assembly size increases due to center-to-center spacing requirements
Solution Approach 1:
The patent combines multiple electrical contacts (first and second contacts) into a single probe body, allowing multiple signals to be transmitted through one probe location rather than requiring separate probes for each contact. This merging of functions reduces the overall assembly size while maintaining reliable electrical connections for multiple circuits.
Solution Approach 2:
The probe is designed to perform multiple functions simultaneously - it can transmit multiple electrical signals through different contacts within the same probe structure, and can operate in both extended and retracted configurations to accommodate varying gap dimensions. This multi-functionality eliminates the need for multiple separate probes.
2Adaptability or versatility
If multiple separate spring probes are used to transmit multiple signals, then signal transmission capability is improved, but the device complexity and space requirements increase
Solution Approach 1:
Multiple electrical contacts are integrated within a single probe body structure, reducing the number of discrete components needed. The first and second contacts are housed together with shared structural elements (barrel, plunger assembly, bias element), simplifying the overall device complexity while maintaining the ability to transmit multiple signals.
Solution Approach 2:
The single probe structure is designed to handle multiple electrical signals simultaneously through its multiple contacts, providing versatile signal transmission capability. The probe can also adapt between extended and retracted positions, further enhancing its multi-functionality without requiring multiple separate devices.
3Adaptability or versatility
If the plunger assembly is extended to accommodate variable gap dimensions, then adaptability to different spacing is improved, but the probe length and assembly size increase
Solution Approach 1:
The plunger assembly is nested within the barrel structure, allowing it to extend and retract while maintaining a compact overall form. When not in use, the plunger is retracted into the barrel, minimizing the probe's extended length. This nested configuration provides adaptability to variable gap dimensions without permanently increasing the probe's baseline length.
Solution Approach 2:
The probe incorporates a dynamic plunger assembly that can extend and retract based on the required gap dimension, rather than being a fixed-length structure. The bias element enables the plunger to move dynamically to accommodate different spacing requirements while returning to a compact retracted position when force is applied, optimizing both adaptability and space efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The multiple contact probe effectively increases the number of electrical contacts within a smaller space, reducing the size of the assembly and accommodating variable gap dimensions between electronic components, while maintaining reliable signal transmission.
Implementation Method 1
a bias element engaged with the plunger assembly, wherein the bias element is configured to bias the plunger assembly to the extended configuration
Data Source
AI summary
Disclosed herein are devices and methods for a multiple contact probe. The multiple contact probe may include a first contact interface and a second contact interface. The first contact interface may be electrically isolated from the second contact interface. A plunger assembly may be slidably engaged between the first contact interface and the second contact interface. The plunger assembly may be slidable between an extended configuration and a retracted configuration along a longitudinal direction of the plunger assembly. The plunger assembly may include a first electrical contact and a second electrical contact. The first electrical contact may be in electrical contact with the first contact interface and the second electrical contact may be in electrical contact with the second contact interface. A bias element may be engaged with the plunger assembly, for instance, the bias element may be configured to bias the plunger assembly to the extended configuration.