Multiple-Magnification Fiber-Optic Inspection With a Shared Imager

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Solution Overview

Problem

Conventional optical fiber microscopes are unable to meet the rapid inspection demands for large volumes of fiber-optic cables, leading to inefficiencies and high costs in visual inspections.

Innovation Solution

A fiber-optic cable inspection apparatus with multiple objective assemblies providing different magnification levels, allowing images to be captured at either magnification level without moving the DUT, and a common imager to analyze images for defects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional optical fiber microscopes are used for inspection, then inspection accuracy can be maintained, but inspection time and costs increase due to inability to meet rapid inspection demands

Engineering Contradiction:
Improveinspection speedVSAvoidinspection time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The inspection process is segmented into multiple magnification levels (first magnification level and second magnification level) with corresponding first and second objective assemblies. This allows the system to perform different types of inspections at appropriate magnification levels, improving overall inspection efficiency by matching inspection depth with magnification level rather than using a single high-magnification setting for all inspections.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically switches between different objective assemblies based on inspection requirements. The controller can select between the first objective assembly and second objective assembly, and the optical path can be dynamically reconfigured using beam splitters and mirrors to route light from either objective to the imager, enabling rapid adaptation to different inspection scenarios without manual intervention.

Inventive Principle:
Principle #15Dynamics

2Adaptability or versatility

If multiple microscopes are used to provide different magnification levels, then magnification versatility is improved, but device complexity and costs increase

Engineering Contradiction:
Improvemagnification level optionsVSAvoidnumber of microscope systems
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The system merges multiple objective assemblies (first and second objective assemblies with different magnification levels) into a single integrated inspection system that shares common components including the imager, controller, DUT interface, and optical path elements. This consolidation provides multiple magnification options while reducing the number of separate microscope systems needed, thereby lowering overall system complexity and cost.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The single imager is designed to receive optical signals from multiple different objective assemblies through a universal optical path that includes beam splitters and mirrors. This universal design allows one imager to perform the function of multiple dedicated imagers, enabling magnification versatility without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus reduces inspection time and costs by enabling efficient, accurate inspection of fiber-optic cables at multiple magnification levels, distinguishing between various types of defects, and minimizing the need for redundant inspections.

Implementation Method 1

an optical system to direct light from the DUT to the imager

Methodology Applied
Scientific EffectOptical imaging: Lens

Data Source

PatentUS20250231083A1Multiple magnification inspection of duts
Publication Date: 2025.07.17 VIAVI SOLUTIONS INC(US)
  • US20250231083A1 patent drawing
  • US20250231083A1 patent drawing
  • US20250231083A1 patent drawing

AI summary

According to examples, an apparatus for inspecting a device under test (DUT) may include a chassis and an optical system having a camera assembly, a first objective assembly having a first magnification level, and a second objective assembly having a second magnification level. The apparatus may also include a DUT interface including an opening in the chassis through which an end of a DUT inserted into the opening of the DUT interface is selectively visible to one of the first objective assembly and the second objective assembly, in which at least one of the DUT interface and the optical system is movable with respect to the other one of the DUT interface and the optical system.