Multiple Resistivity Distribution Curves for Borehole Correlation
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Solution Overview
Problem
Conventional resistivity data analysis in borehole drilling is limited and lacks reliability for primary analysis of subterranean formation geology or object localization, necessitating the use of additional data types for accurate localization.
Innovation Solution
Generating and correlating multiple resistivity distribution curves with offset logs to improve localization accuracy, utilizing inversion algorithms and 3D volumetric visualization for real-time geo-steering, and synchronizing multiple view perspectives of the borehole and subterranean formations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional resistivity data analysis is used with limited distribution curves (1-4 curves), then the analysis process is simple, but the reliability and confidence of subterranean formation localization is insufficient
Solution Approach 1:
The patent segments the resistivity data analysis by generating multiple distribution curves (greater than four) from the resistivity data, each curve representing different statistical percentiles (e.g., 10th, 25th, 50th, 75th, 90th percentiles). This segmentation allows for more detailed analysis of formation characteristics and improves localization reliability without requiring additional hardware
Solution Approach 2:
The patent adds a statistical dimension to the traditional resistivity analysis by creating distribution curves that show the probability density of resistivity values at different depths. This transforms the analysis from simple point measurements to a comprehensive statistical view, enabling more reliable formation identification and correlation with offset logs
2Measurement precision
If multiple distribution curves (greater than four) are generated and correlated with offset logs, then the measurement precision of formation surfaces is improved, but the device complexity and processing requirements increase
Solution Approach 1:
The patent creates multiple copies of the resistivity data in the form of distribution curves at different statistical percentiles. These curves serve as redundant representations that can be correlated with offset logs to verify formation identities and improve measurement precision. The copying approach allows comprehensive analysis without requiring additional physical measurement devices
Solution Approach 2:
The patent implements a feedback mechanism by correlating the generated distribution curves with existing offset logs. The correlation process provides feedback on the accuracy of formation surface identification, allowing for validation and refinement of the localization results. This feedback loop enhances measurement precision by comparing multiple independent data sources
Data Source
AI summary
The disclosure presents processes that utilize collected resistivity data, for example, from an ultra-deep resistivity tool located downhole a borehole. In some aspects, each slice of resistivity data can generate multiple distribution curves that can be overlaid offset resistivity logs. In some aspects, an analysis can be performed to identify trends in the distribution curves that can be used to identify approximate locations of subterranean formation surfaces, shoulder beds, obstacles, proximate boreholes, and other borehole and geological characteristics. As the number of distribution curves generated increase, the confidence in the analysis also increases. In some aspects, the number of distribution curves can be twenty, one hundred, one hundred and one, or other counts of distribution curves. In some aspects, the resistivity data can be used to generate two or more synchronized view perspectives of a specific location along the borehole, where each view perspective uses the same focus area.