Multiplexer Coupling P1500 Interface to DA Test Pads

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Solution Overview

Problem

The P1500 interface in memory devices lacks test pads, making it inaccessible to test probes, while the direct access (DA) interface has test pads, allowing for probe testing, but there is a need to verify the P1500 control circuit using a probe test.

Innovation Solution

A multiplexer is used to operably couple the P1500 interface with a portion of the DA interface, enabling test probe access to the P1500 control circuit via the test pads of the DA interface, allowing the P1500 control circuit to be verified during probe tests.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If the P1500 interface is used in memory devices, then the interface functionality is provided, but the interface is inaccessible to test probes

Engineering Contradiction:
Improvetest probe accessibilityVSAvoidinterface functionality
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent introduces a multiplexer as an intermediary component that enables test probes to access the P1500 control circuit indirectly. The multiplexer acts as a mediator between the test probe interface and the P1500 control circuit, allowing test signals to reach the control circuit through the multiplexer's switching capability without requiring direct physical access to the P1500 interface pads.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If the DA interface is used for testing, then test probe access is enabled, but the P1500 control circuit cannot be directly tested

Engineering Contradiction:
Improvetest probe accessibilityVSAvoidinterface compatibility
Core Design Contradiction:
Ease of operationVSAdaptability or versatility

Solution Approach 1:

The multiplexer provides dynamic switching capability that allows the system to adapt between different interface modes. By dynamically configuring the multiplexer's connection states, the system can switch between direct DA interface testing and indirect P1500 control circuit testing, making the testing infrastructure versatile and adaptable to different test requirements.

Inventive Principle:
Principle #15Dynamics

3Adaptability or versatility

If the P1500 interface is disabled, then system configuration flexibility is improved, but P1500 protocol functionality is lost

Engineering Contradiction:
Improvesystem configuration flexibilityVSAvoidP1500 protocol functionality
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The multiplexer enables the testing infrastructure to serve multiple functions: it can test both the DA interface directly and the P1500 control circuit indirectly. This multi-functionality ensures that P1500 protocol functionality can be verified even when the P1500 interface is disabled or configured differently, maintaining reliability across various system configurations.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11067628B2Replication of a first interface onto a second interface and related systems, methods, and devices
Publication Date: 2021.07.20 MICRON TECHNOLOGY INC
  • US11067628B2 patent drawing
  • US11067628B2 patent drawing
  • US11067628B2 patent drawing

AI summary

Disclosed herein are systems, methods, and devices that enable access to a first interface control circuit via test probes of a second interface. In some embodiments a memory device includes a first interface including first ports that are inaccessible to a test probe. The memory device also includes a first interface control circuit configured to control operation of the first interface. The memory device further includes a second interface including second ports. At least a portion of the second ports include test pads that are accessible to the test probe. In addition, the memory device includes a multiplexer configured to operably couple the first interface and at least a portion of the second interface to the first interface control circuit. The multiplexer is configured to selectively enable test probe access to the first interface control circuit via the test pads.