Multiplexer Coupling P1500 Interface to DA Test Pads
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Solution Overview
Problem
The P1500 interface in memory devices lacks test pads, making it inaccessible to test probes, while the direct access (DA) interface has test pads, allowing for probe testing, but there is a need to verify the P1500 control circuit using a probe test.
Innovation Solution
A multiplexer is used to operably couple the P1500 interface with a portion of the DA interface, enabling test probe access to the P1500 control circuit via the test pads of the DA interface, allowing the P1500 control circuit to be verified during probe tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If the P1500 interface is used in memory devices, then the interface functionality is provided, but the interface is inaccessible to test probes
Solution Approach 1:
The patent introduces a multiplexer as an intermediary component that enables test probes to access the P1500 control circuit indirectly. The multiplexer acts as a mediator between the test probe interface and the P1500 control circuit, allowing test signals to reach the control circuit through the multiplexer's switching capability without requiring direct physical access to the P1500 interface pads.
2Ease of operation
If the DA interface is used for testing, then test probe access is enabled, but the P1500 control circuit cannot be directly tested
Solution Approach 1:
The multiplexer provides dynamic switching capability that allows the system to adapt between different interface modes. By dynamically configuring the multiplexer's connection states, the system can switch between direct DA interface testing and indirect P1500 control circuit testing, making the testing infrastructure versatile and adaptable to different test requirements.
3Adaptability or versatility
If the P1500 interface is disabled, then system configuration flexibility is improved, but P1500 protocol functionality is lost
Solution Approach 1:
The multiplexer enables the testing infrastructure to serve multiple functions: it can test both the DA interface directly and the P1500 control circuit indirectly. This multi-functionality ensures that P1500 protocol functionality can be verified even when the P1500 interface is disabled or configured differently, maintaining reliability across various system configurations.
Data Source
AI summary
Disclosed herein are systems, methods, and devices that enable access to a first interface control circuit via test probes of a second interface. In some embodiments a memory device includes a first interface including first ports that are inaccessible to a test probe. The memory device also includes a first interface control circuit configured to control operation of the first interface. The memory device further includes a second interface including second ports. At least a portion of the second ports include test pads that are accessible to the test probe. In addition, the memory device includes a multiplexer configured to operably couple the first interface and at least a portion of the second interface to the first interface control circuit. The multiplexer is configured to selectively enable test probe access to the first interface control circuit via the test pads.


