Multiport Interconnect Simulation via Port Separation and Data Reduction

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Solution Overview

Problem

SPICE-based circuit simulation systems face inefficiencies when analyzing electrical systems with multiport interconnect structures, particularly due to the significant increase in simulation time as the number of ports increases, as they lack compact models for distributed circuit elements.

Innovation Solution

A method and apparatus that utilize a port separation engine and data reduction engine to generate reduced data modeling an electrically equivalent interconnect structure with fewer ports, facilitating faster circuit simulation by separating and combining data for exposed and non-exposed ports, and applying rational fitting and passivity enforcement.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a SPICE-based analysis engine is used to simulate a circuit with a multiport interconnect structure, then the simulation can be performed using standard compact models, but the simulation time increases by an order of O(N^3) as the number of ports (N) increases

Engineering Contradiction:
Improvesimulation accuracyVSAvoidsimulation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the multiport interconnect structure into smaller sub-networks or blocks, each with fewer ports. By dividing the large N-port structure into multiple smaller blocks that can be simulated independently or with reduced complexity, the overall simulation time is reduced while maintaining accuracy through proper interfacing of the segmented blocks.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates simplified models or equivalents of the multiport interconnect structure that capture the essential electrical behavior with reduced complexity. These simplified models serve as copies that approximate the original structure's behavior but require significantly less computational resources to simulate, avoiding the O(N^3) time complexity.

Inventive Principle:
Principle #26Copying

2Measurement precision

If no compact model exists for a distributed circuit element in the simulation system library, then the element can be accurately modeled using physics-based distributed modeling, but the simulation becomes computationally intensive

Engineering Contradiction:
Improvemodeling accuracyVSAvoidsimulation efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent transforms the distributed circuit element model from a physics-based continuous representation into an equivalent lumped-parameter model or a reduced-order model with fewer parameters. By changing the mathematical representation from distributed to concentrated parameters, the model maintains accuracy for the intended frequency range while dramatically reducing computational complexity.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates simplified equivalent models that copy the essential electrical characteristics of distributed elements without requiring full physics-based distributed modeling. These equivalent models use simplified circuit representations (such as pi-models, T-models, or frequency-dependent equivalent circuits) that capture the dominant behavior while being computationally efficient to simulate.

Inventive Principle:
Principle #26Copying

Data Source

PatentUS10229234B2Method and apparatus to facilitate simulating a circuit connected to a multiport interconnect structure
Publication Date: 2019.03.12 NXP USA INC
  • US10229234B2 patent drawing
  • US10229234B2 patent drawing
  • US10229234B2 patent drawing

AI summary

A method facilitates simulating a plurality of circuit elements connected to a multiport interconnect structure having a first set of ports. The method includes: receiving a first set of data that models electrical behavior of the first set of ports and a first portion of the plurality of circuit elements; determining a first subset of the first data, which models electrical behavior of a set of exposed ports of the first set of ports, and a second subset of the first data, which models electrical behavior of a set of non-exposed ports of the first set of ports and the first portion of the plurality of circuit elements; and combining the second subset of the first data into the first subset of the first data to generate a second set of data that models electrical behavior of a second interconnect structure having fewer ports than the multiport interconnect structure.