Multi-Scan LiDAR Offset Control for Uniform 3D Point Clouds

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Solution Overview

Problem

Existing laser scanning devices face limitations in achieving high spatial resolution and uniform distribution of sample points in 3D point clouds due to constraints on deflection period, pulse repetition rate, and blind ranges, leading to uneven sampling and reduced quality of the 3D point cloud.

Innovation Solution

The device employs multiple scanning units that emit and receive laser beams simultaneously, with controlled spatial and temporal offsets to ensure scan lines do not coincide, allowing for increased sampling points and uniform distribution across the environment, thereby enhancing resolution and quality of the 3D point cloud.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If the deflection period is shortened to increase scanning speed, then the distance between consecutive scan lines decreases, but the resolution within a scan line reduces due to fewer sample points

Engineering Contradiction:
Improvescanning speedVSAvoidresolution within scan line
Core Design Contradiction:
SpeedVSMeasurement precision

Solution Approach 1:

The patent divides the scanning function into multiple independent scanning units, each capable of emitting laser beams and receiving reflections. This segmentation allows parallel processing of scanning tasks, effectively increasing the number of sample points without requiring shorter deflection periods, thus maintaining both scanning speed and resolution.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple scanning units are combined to work simultaneously, with their scan lines arranged in parallel arrays. The control device coordinates these units to offset their scan line sets, creating a unified scanning system that achieves higher resolution through combined sampling points from multiple units.

Inventive Principle:
Principle #5Merging (Combining)

2Measurement precision

If the pulse repetition rate is increased to improve sampling density, then the number of sampling points increases, but MTA zones expand causing blind ranges at edges

Engineering Contradiction:
Improvesampling densityVSAvoidblind ranges
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent segments the measurement task across multiple scanning units, each operating with its own pulse repetition rate and MTA zone. By distributing the sampling points across multiple units with offset scan lines, the system achieves high sampling density without expanding individual MTA zones, thus minimizing blind ranges.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a spatial dimension by arranging scan lines from multiple scanning units in parallel arrays with specific offsets. This dimensional arrangement allows the system to overcome the one-dimensional limitation of single-unit MTA zones, enabling continuous coverage across extended distance ranges.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Measurement precision

If multiple scanning units are added to increase sampling points, then spatial resolution improves, but scan line coincidence occurs reducing measurement quality

Engineering Contradiction:
Improvespatial resolutionVSAvoiduniformity of sampling distribution
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The control device dynamically offsets the scan line sets of different scanning units based on their relative positions and scanning speeds. This dynamic coordination ensures that scan lines from multiple units are spatially separated to avoid coincidence, while maintaining uniform sampling distribution across the measurement area.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The control device receives information about the scanning units' positions and speeds, using this feedback to calculate and adjust the offsets between scan line sets. This feedback mechanism ensures optimal spacing between scan lines from different units, preventing coincidence and ensuring uniform sampling density.

Inventive Principle:
Principle #23Feedback

4Productivity

If the relative speed is increased to improve productivity, then the number of scan lines per unit time increases, but the distance between scan lines increases reducing resolution

Engineering Contradiction:
Improvenumber of scan lines per unit timeVSAvoiddistance between scan lines
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent merges multiple scanning units to work simultaneously at high speeds. Each unit maintains its own scan line generation capability, and by combining the output of multiple units with offset scan lines, the system achieves high productivity through parallel scanning while maintaining fine resolution through the distributed sampling points.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables rapid and high-quality generation of 3D point clouds with improved spatial resolution and uniform sampling, overcoming limitations of single-unit scanning devices by doubling the sampling points and ensuring consistent coverage.

Implementation Method 1

measuring the time of flight of laser beams reflected therefrom

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 2

measuring the time of flight of laser beams reflected therefrom in a coordinate system

Methodology Applied
Scientific EffectTime of flight: Time of Flight

Data Source

PatentEP4063900B1Device for measuring an environment
Publication Date: 2026.05.13 RIEGL LASER MEASUREMENT SYSTEMS
  • EP4063900B1 patent drawingFigure 1~2
  • EP4063900B1 patent drawingFigure 3a~3c
  • EP4063900B1 patent drawingFigure 4~5

AI summary

Device for measuring an environment (2) moving relative to the device (1) by measuring the time of flight of laser beams (4) reflected therefrom, comprising a first and at least one further scan unit (5k), each for emitting a laser beam (4k) over a sequence (Fk) of deflection periods (APk,p) with a respective deflection period duration (TAP), which passes through a scan fan (6k) in each deflection period (APk,p) and scans the environment (2) along a scan line (7k), wherein the scan lines (7k,p) of each scan unit (5k) form a set of scan lines (10k), and for receiving the associated laser beam (4k) reflected from the environment (2), and a control device (22) connected to the at least one further scan unit (5k), which is configured toto shift the scan line set (10k) of each further scan unit (5k) relative to the scan line set (10k) of an adjacent scan unit (5k-1) in the direction of movement (R) by a position offset (ΔSk,k-1) dependent on the relative velocity (v) and the deflection period (TAP) such that their sampling points (Pk,n) coincide.