Multi-Wavelength Scintillator Detector for Cargo Inspection

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Solution Overview

Problem

Existing cargo inspection systems using inspection radiation often suffer from suboptimal resolution and contrast in images derived from signals, despite generating large detection signals.

Innovation Solution

A scanning apparatus comprising multiple scintillators and sensors that re-emit light in different wavelength domains, allowing for increased resolution and contrast by measuring energy deposition specifically at the first scintillator's area, while the second scintillator provides better contrast with a larger exposed area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a single large-area scintillator is used to increase signal size, then detection signal strength is improved, but image resolution deteriorates

Engineering Contradiction:
Improvedetection signal strengthVSAvoidimage resolution
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The detector is divided into multiple scintillator elements (first scintillator, second scintillator, third scintillator) with different area sizes. Each scintillator element processes a portion of the radiation signal, allowing the system to aggregate signals from multiple elements to achieve both high signal strength and high resolution through pixelated detection architecture.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If multiple scintillators with different areas are used, then both signal strength and resolution can be optimized, but device complexity increases

Engineering Contradiction:
Improveimage resolutionVSAvoiddetector structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Different scintillator elements are assigned different area sizes based on their specific function: larger scintillators (second scintillator) for high signal detection in regions requiring sensitivity, smaller scintillators (first and third scintillators) for high-resolution imaging. This local optimization allows each element to be tailored to its detection needs while maintaining overall system simplicity through modular design.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances image resolution in specific directions and improves contrast, enabling more effective detection of concealed objects within cargo by optimizing the measurement of energy deposition and light sensitivity.

Implementation Method 1

at least one first scintillator (3) configured to, in response to interaction with a pulse (5) of inspection radiation, re-emit first light (6) in a first wavelength domain

Methodology Applied
Scientific EffectScintillation: Scintillation

Implementation Method 2

at least one second scintillator (4) configured to, in response to interaction with the pulse (5) of inspection radiation, re-emit second light (7) in a second wavelength domain different from the first wavelength domain

Methodology Applied
Scientific EffectScintillation: Scintillation

Implementation Method 3

at least one first sensor (8) configured to measure the first light (6) and not the second light (7)

Methodology Applied
Scientific EffectPhotodetection: Photoelectric Effect

Data Source

PatentEP3596510B1Method and detector for inspection system
Publication Date: 2024.07.24 SMITHS DETECTION FRANCE SAS
  • EP3596510B1 patent drawingFigure 1A~1B
  • EP3596510B1 patent drawingFigure 2
  • EP3596510B1 patent drawingFigure 3A~4B

AI summary

In one embodiment, there is provided detector (1) for an inspection system, comprising: at least one first scintillator (3) configured to, in response to interaction with a pulse (5) of inspection radiation, re-emit first light (6) in a first wavelength domain; at least one second scintillator (4) configured to, in response to interaction with the pulse (5) of inspection radiation, re-emit second light (7) in a second wavelength domain different from the first wavelength domain; and at least one first sensor (8) configured to measure the first light (6) and not the second light (7).