Multi-Site Semiconductor Test Fixture for Real-Time I-V Measurement
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Solution Overview
Problem
Existing semiconductor test equipment is bulky, expensive, difficult to set up, prone to human error, and unstable, especially when testing multiple devices simultaneously.
Innovation Solution
A test fixture and control system that allows for simultaneous electrical and functional testing of multiple semiconductor devices, using a compact setup that reduces human intervention and provides real-time voltage and current measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If general purpose test equipment is used to test semiconductor devices, then measurement versatility is improved, but device complexity and ease of operation deteriorate due to bulky equipment, difficult setup, and cabling arrangement challenges
Solution Approach 1:
The test system is segmented into multiple independent test channels, each capable of performing measurements independently. This allows the system to handle multiple devices simultaneously while maintaining measurement versatility through modular architecture.
Solution Approach 2:
The test fixture incorporates multiple test channels that can perform various electrical measurements (voltage, current, resistance) across multiple devices simultaneously. The system provides universal testing capability through integrated multi-functional test channels rather than requiring separate specialized equipment for each measurement type.
2Productivity
If general purpose test equipment is used to test multiple devices simultaneously, then productivity is improved, but ease of operation worsens due to difficult cabling arrangement and setup
Solution Approach 1:
Multiple test channels and their associated cabling are merged into a single integrated test fixture. The fixture consolidates what would otherwise be separate test setups with independent cabling into one unified device, enabling simultaneous testing of multiple devices while simplifying setup and operation.
Solution Approach 2:
The test fixture acts as an intermediary device that interfaces between the semiconductor devices and the measurement system. It provides a standardized interface that simplifies connections and setup, eliminating the need for complex individual cabling arrangements for each device under test.
3Measurement precision
If general purpose test equipment is used, then measurement capability is improved, but reliability deteriorates due to instability and human error
Solution Approach 1:
The test system incorporates automated measurement and data collection capabilities that reduce human intervention. The fixture automatically performs measurements across multiple channels and records results, minimizing opportunities for human error while maintaining precise measurement capabilities through consistent automated operation.
Solution Approach 2:
The system provides real-time monitoring and feedback of measurement results from multiple devices simultaneously. This enables immediate detection of measurement anomalies or device failures, improving reliability through continuous validation and reducing the impact of potential errors through automated verification processes.
Data Source
AI summary
A semiconductor test system has a test fixture with a plurality of test sites. Each test site has a DUT placement area and an electrical test circuit dedicated for a DUT to perform voltage and current testing. The electrical test circuit has a voltage measuring block and a current measuring block. The voltage measuring block has an analog-to-digital converter for converting an analog voltage measurement to a digital voltage measurement. The current measuring block has a resistor conducting a current to be measured, an amplifier with a first input and a second input coupled across the resistor, and an analog-to-digital converter with an input coupled to an output of the amplifier and an output for providing a digital current measurement. A test control system controls the test fixture. The electrical test circuit can be an integrated circuit or a discrete circuit.