Multispectral Makeup Analysis Using Skin Spectrum Normalization
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Solution Overview
Problem
Existing methods fail to accurately analyze and guide makeup application to ensure natural and uniform application, particularly in areas where skin is thin or thick, and to correct makeup over time.
Innovation Solution
A method and electronic device using a multispectral image sensor to measure and normalize skin reflection spectra, comparing normalized and pre-acquired spectra to analyze makeup conditions and provide a makeup guide.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional single-spectrum imaging methods are used, then device complexity is low, but measurement precision of makeup analysis is insufficient
Solution Approach 1:
The patent segments the spectral measurement into multiple discrete wavelength channels (e.g., blue, green, red, yellow-green, yellow, orange bands). Each channel captures reflection intensity at specific wavelengths, enabling detailed spectral analysis of skin and makeup without requiring a continuous spectrum sensor. This segmentation allows precise makeup detection while using simpler multi-channel sensors instead of complex continuous spectrum instruments.
Solution Approach 2:
The patent transitions from traditional 2D spatial imaging to 3D spectral-spatial imaging by adding wavelength as a third dimension. The multispectral image sensor captures reflection intensities across multiple wavelength bands, creating a spectral signature for each pixel. This dimensional expansion enables differentiation of makeup materials based on their unique spectral characteristics, significantly improving analysis accuracy.
2Measurement precision
If multispectral imaging with multiple wavelengths is implemented, then makeup analysis accuracy improves, but device complexity increases
Solution Approach 1:
The patent performs preliminary normalization of reflection spectra by removing illuminant effects before makeup analysis. The system pre-processes the spectral data by comparing measured reflection intensities against reference spectra, normalizing the data to account for lighting conditions. This preliminary action simplifies subsequent makeup detection by eliminating the need for complex real-time illuminant estimation and separation.
Solution Approach 2:
The patent introduces reference spectra as an intermediary between the raw multispectral measurements and the final makeup analysis. By comparing measured reflection spectra against pre-acquired reference spectra of known materials, the system mediates the complex relationship between multiple wavelength measurements and makeup properties. This intermediary approach simplifies the analysis by providing a standardized comparison framework.
3Reliability
If reflection spectrum normalization is performed, then makeup analysis reliability improves, but processing time increases
Solution Approach 1:
The patent performs normalization processing in advance by pre-acquiring reference spectra under controlled lighting conditions. These reference spectra are stored and reused for multiple measurements, eliminating the need to perform complex normalization calculations for each new measurement. This preliminary action maintains high reliability while significantly reducing processing time for routine analyses.
Solution Approach 2:
The patent simplifies the normalization process by changing the computational parameters from full spectral decomposition to targeted wavelength-band comparison. Instead of processing the entire spectrum, the system focuses on specific wavelength ranges where makeup materials exhibit characteristic reflection patterns. This parameter change reduces computational complexity while maintaining analysis reliability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate analysis of makeup application, ensuring uniformity and correction, by identifying makeup presence, concentration, and type, and guiding users on appropriate application.
Implementation Method 1
measuring a reflection spectrum of skin by the multispectral image sensor
Implementation Method 2
emitting electromagnetic waves by a light source through a first polarizing plate to the skin, and measuring, by the multispectral image sensor, the electromagnetic waves that have been reflected by the skin and have passed through a second polarizing plate that has a polarizing axis perpendicular to a polarizing axis of the first polarizing plate
Data Source
AI summary
Provided is a method of analyzing makeup by a multispectral image sensor, the method including measuring a reflection spectrum of skin by the multispectral image sensor, normalizing the measured reflection spectrum by matching a value of the measured reflection spectrum and a value of a pre-acquired reflection spectrum at two wavelengths, and analyzing makeup of the skin based on a comparing the normalized reflection spectrum and the pre-acquired reflection spectrum at a specific wavelength.