Multi-Wavelength Optical Measurement for Complex Structure Analysis
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Solution Overview
Problem
Existing optical measurement methods struggle to accurately estimate the physical properties of objects with complex structures by solely relying on intensity modulation, as they fail to account for phase modulation and wavelength-dependent diffraction patterns.
Innovation Solution
An optical measurement method that utilizes a bright-field optical system to capture images at multiple wavelengths, followed by dark-field conversion and hue generation processing to extract information about the object's physical properties, including shape, size, and density distribution, using a combination of imaging elements capable of distinguishing different wavelength spectra and a processing unit to analyze the resulting images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If only intensity modulation is used for optical measurement, then the measurement method is simple, but the measurement precision for complex structures deteriorates
Solution Approach 1:
The patent changes the wavelength parameter of light to capture wavelength-dependent diffraction patterns. By illuminating the object with light of multiple wavelengths and analyzing the spectral variations in diffraction patterns, the system extracts both intensity and phase information, thereby improving measurement precision for complex structures without significantly increasing system complexity
Solution Approach 2:
The patent transitions from single-wavelength intensity measurement to multi-wavelength spectral measurement, adding the wavelength dimension to the measurement space. This dimensional expansion enables the system to capture phase modulation information through spectral analysis, resolving the limitation of intensity-only measurement methods
2Loss of information
If multi-wavelength imaging is performed, then the information regarding physical properties is improved, but the measurement time increases
Solution Approach 1:
The patent combines multiple wavelength measurements into a single spectral analysis process. By capturing the diffraction pattern across a spectrum of wavelengths simultaneously (or in rapid succession) and processing the data through spectral analysis, the system extracts comprehensive physical property information while minimizing the time penalty associated with multi-wavelength measurement
3Measurement precision
If dark-field conversion is performed for each wavelength, then the diffraction pattern analysis is improved, but the processing complexity increases
Solution Approach 1:
The patent extracts the diffracted light component from the total light field through dark-field conversion processing applied to multi-wavelength images. By separating and analyzing the diffraction pattern at each wavelength independently, then combining the results through spectral analysis, the system achieves high-precision diffraction pattern extraction while managing processing complexity through systematic decomposition of the measurement problem
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise estimation of physical properties such as density, volume, and concentration ratios of objects by leveraging wavelength-dependent diffraction patterns, providing a non-contact method for structural analysis.
Implementation Method 1
capturing and acquiring object image data by an imaging element configured to distinguish a spectrum including the first wavelength and a spectrum including the second wavelength by each pixel
Implementation Method 2
when an object having an appropriate structure is irradiated with light, diffraction of light occurs that depends on the structure of the object
Data Source
AI summary
According to the embodiment, an optical measurement method includes: forming an object image including at least a part of the object by a bright-field optical system, and capturing and acquiring object image data by an imaging element configured to distinguish spectrums including first and second wavelengths by each pixel; performing dark-field conversions for the first wavelength to obtain first converted image data and for the second wavelength to obtain second converted image data, based on the object image data; performing hue generation processing of generating hue image data based on the first and second converted image data; and estimating information regarding a physical property of the object based on the hue image data.