Multi-Wavelength Phase Mask for Microscopy Illumination
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Solution Overview
Problem
Current microscopic imaging methods face challenges in achieving high resolution and accuracy when using coherent light of multiple wavelengths due to wavelength-dependent imaging behavior of optical elements, leading to losses in resolution and accuracy, and require complex and costly structuring techniques for beam shaping.
Innovation Solution
An optimized overall phase mask is calculated to generate desired illumination for all wavelengths, using target phase functions specific to each wavelength, which are combined to form a diffraction grating or phase mask that can be realized using a stack of materials or a spatial light modulator, allowing for simultaneous or successive illumination with coherent light of multiple wavelengths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If light of multiple wavelengths is used for illumination, then the illumination can cover a broader spectral range, but the resolution and accuracy of imaging deteriorate due to wavelength-dependent optical behavior
Solution Approach 1:
The patent segments the multi-wavelength illumination problem by calculating separate target phase functions for each wavelength and then combining them into an overall phase mask. This segmentation allows each wavelength to be optimized independently while maintaining overall system performance.
Solution Approach 2:
The patent changes the phase parameter of the illumination light by using phase masks with location-dependent phase shifts for different wavelengths. This parameter change compensates for the wavelength-dependent optical behavior and maintains imaging accuracy across the spectral range.
2Shape
If conventional structuring techniques are used for beam shaping with multiple wavelengths, then the illumination can be structured, but the device complexity and cost increase significantly
Solution Approach 1:
The patent merges multiple wavelength-specific phase functions into a single overall phase mask that can be implemented with one optical element. This combining approach eliminates the need for multiple separate structuring components for different wavelengths.
Solution Approach 2:
The overall phase mask serves as a universal optical element that handles beam shaping for multiple wavelengths simultaneously. This multi-functional approach replaces what would traditionally require multiple wavelength-specific components.
3Measurement precision
If diffractive phase gratings are used for structured illumination, then the spatial resolution can be increased, but the orders of diffraction for different wavelengths do not lie congruently, causing resolution loss
Solution Approach 1:
The patent applies local quality by using phase masks with location-dependent phase shifts that are specifically tailored for each wavelength. This allows the diffraction orders for different wavelengths to be aligned congruently in the image plane, resolving the alignment problem.
Solution Approach 2:
The patent creates a calculated overall phase mask that copies and combines the optimal phase functions for each wavelength. This calculated copy ensures that all wavelengths produce congruent diffraction orders without requiring physical trial-and-error adjustment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies the generation of structured illumination, eliminating the need for complex measures while maintaining the same accuracy and resolution as single-wavelength illumination, and allows for flexible adaptation to different conditions and sample structures.
Implementation Method 1
A resolution-increasing illumination light structure is impressed on illumination light with m wavelengths through a phase mask
Implementation Method 2
The target phase functions are used to generate an overall phase mask through which the sample is illuminated simultaneously or successively with coherent light of the wavelengths
Data Source
AI summary
A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths λi, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφi(x, y, λi) is effective only for the corresponding wavelength λi. The target phase functions Δφi are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφi(x, y, λi). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths λi such that the predefined structure of the illumination light is generated in the region of the sample.