Multi-Well Plate Imaging With Reflector-Guided Oblique Illumination
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Solution Overview
Problem
Existing observation apparatuses face challenges in achieving high observation performance with oblique illumination, particularly when using multi-well plates with small well diameters such as 96-well plates, due to difficulties in guiding light at the proper angle for high-contrast imaging.
Innovation Solution
The observation apparatus employs a reflector installed above the multi-well plate to direct marginal rays via peripheral wells instead of the on-axis well, ensuring oblique illumination and high-contrast imaging by condensing light at appropriate angles using an observation optical system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a reflector is used to achieve oblique illumination for high-contrast imaging, then imaging contrast is improved, but the apparatus size increases
Solution Approach 1:
The patent transitions from traditional lateral oblique illumination to vertical oblique illumination by positioning the reflector above the multi-well plate and directing light at angles greater than the critical angle. This dimensional change allows oblique illumination to be achieved within the limited vertical space of the incubator without increasing the horizontal footprint of the apparatus.
Solution Approach 2:
The reflector acts as an intermediary component that redirects light from the illumination optical system to achieve oblique illumination. By positioning the reflector above the multi-well plate and using its reflective surface to direct light at appropriate angles, the system achieves high-contrast imaging without requiring direct lateral illumination paths that would increase apparatus size.
2Device complexity
If light is guided through the on-axis well for illumination, then optical path is simplified, but imaging contrast deteriorates due to lack of oblique illumination
Solution Approach 1:
The patent introduces asymmetry in the optical path by deliberately guiding light through peripheral wells rather than the on-axis well. This asymmetric light path ensures that light enters the on-axis well at oblique angles greater than the critical angle, creating the necessary conditions for high-contrast imaging while maintaining a relatively simple overall optical system.
Solution Approach 2:
Instead of changing the lateral position of the illumination source, the patent changes the vertical dimension of the optical path by positioning the illumination optical system below the multi-well plate and using a reflector above it. This vertical arrangement allows oblique illumination to be achieved without complicating the lateral optical path.
3Area of stationary object
If the observation optical system is positioned close to the multi-well plate for compact design, then apparatus size is reduced, but light condensation at proper angles becomes difficult
Solution Approach 1:
The reflector serves as an intermediary that decouples the positioning requirements of the illumination and observation systems. By placing the reflector above the multi-well plate at a distance where it can effectively redirect light at oblique angles, the system maintains proper light condensation angles even when the observation optical system is positioned close to the plate for compact design.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for high-contrast imaging of samples in multi-well plates with small well diameters by effectively utilizing light from peripheral wells, enhancing the observation quality and maintaining the integrity of the culture environment.
Implementation Method 1
a reflector provided above the installation position, the reflector being configured to reflect light emitted from the illumination optical system
Implementation Method 2
an observation optical system provided below the installation position, the observation optical system being configured to condense the light reflected by the reflector
Data Source
AI summary
An observation apparatus includes: an illumination optical system provided below an installation position of a multi-well plate; a reflector provided above the installation position, the reflector being configured to reflect light emitted from the illumination optical system; and an observation optical system provided below the installation position, the observation optical system being configured to condense the light reflected by the reflector. The reflector is installed such that a marginal ray to enter the observation optical system travels via a peripheral well different from an on-axis well located on an optical axis of the observation optical system before reflection due to the reflector.